Agilent / Keysight 86145A Optical Spectrum Analyzer-portable unit

The Agilent/Keysight 86145A is a portable optical spectrum analyzer delivering precise wavelength and spectral characterization across 600 nm to 1700 nm. Field-deployable at 14.5 kg, it combines high-resolution measurement capability with rapid sweep performance for telecommunications, CATV, and research environments.

– Technical Specifications

Wavelength Range: 600 nm to 1700 nm with continuously variable span from 0.2 nm to full range. Wavelength accuracy reaches ±0.025 nm (1510–1570 nm) after internal calibration, with ±10 pm repeatability between 1480–1565 nm using the internal gas cell calibrator. Tuning repeatability is ±0.003 nm; span linearity maintains ±0.05 nm for spans under 40 nm and ±0.02 nm in the 1525–1570 nm window.

Spectral resolution bandwidth (FWHM) is selectable from 0.06 nm to 10 nm across eight discrete steps. Sensitivity varies by band: –60 dBm (600–750 nm), –75 dBm (750–1250 nm), –90 dBm (1250–1610 nm), and –80 dBm (1610–1700 nm). Dynamic range achieves –70 dB at 0.5 nm resolution.

Sweep performance enables minimum cycle times of 180 ms (50 nm span, auto zero off) to 650 ms (500 nm span). Maximum sweep rate is 40 nm/50 ms. Zero-span sampling reaches 50 µs per trace point with ADC trigger jitter under ±0.5 µs.

Amplitude measurement accuracy is ±0.05 dB with scale fidelity of ±0.05 dB for fixed reference levels. Maximum safe input is +20 dBm instantaneous and +30 dBm total.

– Key Features

• Portable form factor: 163 mm × 325 mm × 427 mm
• Operating range: 0°C to 55°C; storage to 70°C
• Humidity rated to 95% RH non-condensing
• Integrated gas cell calibration for repeatable ±10 pm accuracy
• User calibration options with ±0.05 nm accuracy within ±40 nm of calibration signal
• Factory calibration cycle: ±0.5 nm absolute accuracy (2-year cycle)

– Typical Applications

Field deployment for fiber optic installation and maintenance. Component characterization in wavelength-division multiplexing systems. Broadband source spectral analysis and system validation across visible and near-infrared bands.