Agilent/Keysight 6614C DC Power Supply

The Keysight 6614C is a 50 W single-output DC power supply engineered for precision voltage and current control in automated testing and sensitive circuit development. This half-rack instrument delivers 0–100 V at 0–0.5 A with programming accuracy of ±50 mV (voltage) and ±0.05% + 0.5 mA (current) at 25°C ±5°C. Ultra-low output noise—0.5 mV RMS and 5 mV peak-to-peak across 20 Hz to 20 MHz—makes it suitable for low-noise applications. Fast transient response recovers within 0.1% of programmed voltage in under 100 µs, while settling time reaches within 1 LSB in less than 6 ms.

– Technical Specifications

• Output Rating: 0–100 V, 0–0.5 A (50 W total)
• Voltage Ripple & Noise: 0.5 mV RMS, 5 mV peak-to-peak (20 Hz–20 MHz)
• Load Regulation: ±5 mV
• Line Regulation: ±1 mV
• Programming Accuracy: ±50 mV (voltage); ±0.05% + 0.5 mA (current)
• Current Measurement: Down to microampere levels via built-in measurement
• DC Measurement Accuracy: ±0.03% + 2 mV (voltage)
• Rise/Fall Time: <2 ms (10/90%, 90/10%)
• Settling Time: <6 ms (within 1 LSB)
• Transient Response: <100 µs to 0.1% of voltage
• GPIB Command Processing: <4 ms

– Key Features

• Single-output architecture optimized for focused application control
• Compact half-rack form factor for benchtop and rack-mount integration
• Built-in voltage and current measurement without external instrumentation
• GPIB primary control with RS-232 secondary interface for flexible system integration
• Over-voltage, over-current, and over-temperature protection
• Class I safety classification with protective earth terminal
• EMC compliance per 89/336/EEC (ISM 1B)

– Typical Applications

• Component and subsystem characterization requiring stable, low-noise excitation
• Automated test systems with GPIB control and real-time measurement feedback
• Sensitive analog circuit development and validation
• Microampere-level current monitoring and load transient testing

– Compatibility & Integration

GPIB and RS-232 interfaces enable integration into automated test benches and system-level applications. Stored states and status reporting streamline multi-point calibration and production workflows.