Agilent/Keysight 8753D

The Agilent/Keysight 8753D is a vector network analyzer for measuring network parameters across laboratory and production environments. It integrates a synthesized RF source, dual-channel receiver, and S-parameter test set to measure magnitude, phase, and group delay of active and passive RF networks. The instrument delivers dynamic range to 110 dB at 3 GHz with 1 Hz frequency resolution, independent display channels, color display, and built-in disk drive storage.

– Technical Specifications

Frequency Range
• Standard: 30 kHz to 3 GHz
• With Option 006: 30 kHz to 6 GHz
• Frequency Resolution: 1 Hz

Dynamic Range
• Up to 110 dB at 3 GHz
• Up to 105 dB at 6 GHz (Option 006)

Output Power
• Maximum: +10 dBm
• Range: -85 dBm to +10 dBm
• Power Accuracy: ±0.05 dB

Measurement Resolutions
• Magnitude: 0.001 dB
• Phase: 0.001° (Phase Range ±180°)
• Electrical Delay: 0.01 ns

Receiver
• Dual-channel, three-input configuration
• Input Impedance: 50 ohms

– Key Features

• Integrated S-parameter test set with TRL/LRM calibration for non-coaxial environments
• Segmented calibration and interpolative error correction
• Harmonic measurement (Option 002): second and third harmonic levels to -40 dBc
• Time domain analysis (Option 010): inverse FFT for reflection/transmission coefficient vs. time; step/impulse response and gating
• Mixer testing with frequency offset capability
• High-stability frequency reference (Option 1D5) for improved accuracy on high-Q devices
• Vector accuracy enhancement
• Power meter control: compatible with Agilent/HP 436A, 437B, or 438A

– Interfaces & Storage

• Built-in disk drive: LIF and DOS formats
• HP-IB (IEEE 488), RS-232, parallel port
• GPIO bus, DIN keyboard interface, fused probe power connector

– Physical Specifications

• Dimensions: 425 mm W × 222 mm H × 508 mm D
• Weight: approximately 34 kg (75 lb)

– Compatibility

Compatible with Agilent test sets 85046A/B, 85047A, and calibration kits including HP 85031B (7mm) and HP 85032B (Type-N). Option 011 enables external test set operation.