HP / Agilent 8114A High Power Pulse Generator, 100 V / 2 A

The HP/Agilent 8114A is a single-channel high-power pulse generator engineered to produce fast, clean positive or negative pulses with user-definable amplitude, current, and duty cycle limits. Operating at pulse repetition rates up to 15 MHz with variable pulse widths and transition times as fast as 7 ns, the instrument delivers 100 V and 2 A into high-impedance loads, or 50 Vpp into 50 Ω matched conditions. Built-in protection features and an inhibit input allow external TTL signals to control output behavior, making it suitable for semiconductor device testing, laser diode driving, and high-speed digital circuit characterization. Full SCPI programmability, external triggering and gating, burst mode capability, and double-pulse generation provide the flexibility demanded by both benchtop evaluation and automated test environments. The instrument maintains low jitter and accurate, repeatable pulse generation across 0°C to 55°C ambient operation following a 30-minute warm-up period.

## Technical Specifications

• Maximum pulse amplitude: 100 V into high-impedance load; 50 Vpp into 50 Ω load
• Maximum pulse current: 2 A
• Pulse transition times: < 12 ns (high-impedance source into 50 Ω); < 7 ns (50 Ω/50 Ω mode)
• Repetition rate: Up to 15 MHz
• Pulse width: Variable
• Baseline voltage: 0 V typical; optional ±25 V shift (Option 001)
• Output waveforms: Positive or negative pulses
• Operating temperature: 0°C to 55°C ambient

## Key Features

• Low jitter and highly repeatable pulse generation
• Programmable voltage, current, and duty cycle limits with DUT protection
• TTL-compatible inhibit input supporting edge and level triggering
• Counted burst mode and configurable double-pulse capability
• External triggering and gating support
• Full SCPI programmability via front-panel graphic display
• Fast memory store/recall of hundreds of instrument configurations (optional 1 MB memory card)

## Typical Applications

• Semiconductor device and component testing
• Laser diode driver evaluation
• High-speed digital circuit characterization
• Automated test system integration

## Compatibility & Integration

External synchronization via manual trigger key or external signal; TTL control inputs for gate enable/disable functionality.