Rohde & Schwarz FSUP50 20Hz – 50GHz Spectrum Analyzer

The Rohde & Schwarz FSUP50 is a dual-function spectrum analyzer and phase noise characterization instrument spanning 20 Hz to 50 GHz. This benchtop platform delivers high-sensitivity phase noise measurement through multiple methods—spectrum analyzer, PLL with cross-correlation, and internal/external reference techniques—combined with comprehensive signal analysis capabilities. Advanced cross-correlation techniques achieve dynamic range enhancement of up to 20 dB and phase noise sensitivity improvement of up to 20 dB, with typical noise floor reaching -165 dBc/Hz at 10 MHz offset. The instrument characterizes oscillators, synthesizers, and VCOs across development and production environments while supporting spurious, harmonic, AM noise, baseband noise, and additive phase noise measurements on both continuous and pulsed signals. With external mixers, frequency coverage extends to 110 GHz.

– Technical Specifications

• Spectrum Analyzer: 20 Hz to 50 GHz
• Signal Source Analyzer: 1 MHz to 50 GHz
• Phase Noise Measurement: Multiple methods covering 1 MHz to 50 GHz (spectrum analyzer method: 10 MHz to 50 GHz; PLL method with cross-correlation: 1 MHz to 26 GHz with B60/B61 options)
• Residual Phase Noise: 1 MHz to 8 GHz with internal phase detector
• External Reference Support: 1 MHz to 8 GHz
• Phase Noise Floor: -60 dBc/Hz (1 Hz offset) to -165 dBc/Hz (10 MHz offset)
• Spurious: -80 dBc to -62 dBc
• Offset Analysis Range: 0.01 Hz to 30 MHz
• Input Power Range: -20 dBm to +30 dBm
• Test Port Adapters: 2.4 mm female and N female connectors
• External Mixer Support: Measurements to 110 GHz

– Key Features

• Cross-correlation technology for enhanced dynamic range and sensitivity
• Integrated low-noise DC outputs for supply and tuning voltages
• VCO parameter and oscillator characterization
• Digital and analog modulated signal analysis
• Pulsed signal measurement capability
• Noise figure and gain measurement support

– Typical Applications

• Oscillator and synthesizer development and production testing
• Phase noise characterization of RF and microwave sources
• VCO parameter extraction and analysis
• Signal integrity assessment in high-frequency systems

– Compatibility & Integration

Optional low-phase-noise enhancement (R&S®FSUP-B60), correlation extension (R&S®FSUP-B61), and low-aging OCXO reference (R&S®FSU-B4) available.