IFR Aeroflex PN9000 Phase Noise Measurement System

The IFR Aeroflex PN9000 Phase Noise Measurement System characterizes spectral purity across a broad frequency spectrum. This modular platform measures phase noise, jitter, frequency stability, and amplitude noise in oscillators, synthesizers, and frequency sources. The base system spans 2 MHz to 1.8 GHz, with optional modules extending capability to 140 GHz.

– Technical Specifications

Frequency Coverage
• Base system: 2 MHz to 1.8 GHz
• Internal phase detectors: Up to 40 GHz (PN9000B) and 50 GHz (PN9000)
• Microwave down-converters: 2 to 18 GHz and higher with external harmonic mixers
• Extended configurations: Up to 140 GHz with specific module combinations

Measurement Performance
• Close-to-carrier resolution: 0.01 Hz from carrier
• Offset analysis range: 0.01 Hz to 1 MHz (optional 40 MHz and 500 MHz ranges)
• Measurement accuracy: ±2 dB to 1 MHz offset; ±3 dB above 1 MHz
• Residual noise floor: −178 dBc/Hz
• Nominal RF input level: +6 dBm to +16 dBm

– Key Features

• Phase Lock Loop, Delay Line, Added Phase Noise, Amplitude Noise, Frequency Stability, and Pulsed measurement modes
• Distinguishes Phase Modulation (PM) and Amplitude Modulation (AM) noise separately
• Plug-in optional modules for expanded range and specialized measurements
• Low Noise Amplifier with auto-gain optimization
• WPN9000 Windows-based software with graphical interface and file management
• Automatic performance adjustments for dynamic range optimization

– Optional Modules & Accessories

• Low Noise DC/FM Reference Synthesizer (PN9100): 2 MHz to 4.5/18 GHz
• Microwave Down-converters (PN925X, PN927X, PN924X) for free-running sources
• Delay Lines (20 ns and 100 ns): 250 MHz to 2 GHz
• Added Noise Measurement (PN9841): 2 to 18 GHz for amplifiers and radar systems
• Frequency Doubler Isolator (PN9908)
• Reference Crystal Oscillators (PN95XX series) and SAW Oscillator (PN9562, 1 GHz)
• Pulse Generator and Modulator (PN9815)
• Buffer Amplifier Isolator (PN9820)

– Typical Applications

Phase noise characterization in research, development, and production environments. Ideal for validating frequency stability in oscillators, synthesizers, and microwave/RF signal sources.