Agilent/Keysight E8361C

The Keysight E8361C is a benchtop microwave network analyzer delivering S-parameter and gain measurements from 10 MHz to 67 GHz. Built for high-speed characterization, it combines 94 dB dynamic range with sub-0.006 dB trace noise and sub-26 µs/point measurement speed across 32 independent channels with up to 20,001 points per channel. The instrument executes S-parameter sweeps, gain compression analysis, frequency and power sweeps, and pulsed-RF testing down to 2 µs pulse widths. Advanced calibration modes—TRL/LRM, on-wafer, in-fixture, waveguide, and antenna—plus ECal module compatibility enable flexible deployment. Output power reaches 10 dBm typical with IF bandwidth up to 15 MHz. Measurement applications span mixer loss and isolation, amplifier harmonics and intermodulation, absolute group delay, materials characterization, and vector/scalar-calibrated converter analysis. The 10.4-inch touch-screen interface includes embedded documentation in five languages, marker/zoom control, and multiport extensibility. Connectivity via 10/100BaseT Ethernet, GPIB, SICL, LAN, and DCOM supports remote operation and integration with test automation frameworks. Compatible calibration kits (85052B 3.5 mm) and flexible test port cables (85131F) simplify deployment across RF, microwave, and millimeter-wave environments.

– Technical Specifications

• Frequency range: 10 MHz to 67 GHz
• Dynamic range: 94 dB
• Trace noise: < 0.006 dB
• Measurement speed: < 26 µs/point
• Measurement channels: 32 independent
• Points per channel: up to 20,001
• Output power: 10 dBm (typical)
• IF bandwidth: up to 15 MHz
• Display: 10.4-inch touch-screen
• Weight: 29 kg (64 lb.)

– Key Features

• S-parameter, gain compression, frequency and power sweep measurements
• Pulsed-RF testing to 2 µs pulse widths
• TRL/LRM, on-wafer, in-fixture, waveguide, and antenna calibration modes
• ECal module compatibility
• Mixer conversion loss, return loss, isolation, and absolute group delay analysis
• Amplifier gain compression, harmonic, and IMD measurements
• Materials and converter (vector/scalar-calibrated) characterization
• Wide power-sweep range

– Typical Applications

• RF and millimeter-wave component testing
• High-frequency design validation and modeling
• Antenna characterization
• On-wafer device measurement
• In-fixture component assessment

– Compatibility & Integration

• Network connectivity: 10/100BaseT Ethernet
• Control interfaces: GPIB, SICL, LAN, DCOM
• USB hub for peripheral expansion
• Compatible with 85052B (3.5 mm) calibration kits
• Compatible with 85131F flexible test port cables
• Multiport and pulsed-RF customization available