Keysight / Agilent / HP 41421B Voltage Source / Monitor Module

The Keysight/Agilent/HP 41421B is a Medium Power Source/Monitor Unit (MPSMU) designed as a plug-in module for the 4142B Modular DC Source/Monitor Mainframe. This module delivers precision voltage and current sourcing with simultaneous monitoring capabilities, making it essential for semiconductor characterization and parametric testing. The 41421B supports dual measurement modes: voltage sourcing with current monitoring, or current sourcing with voltage monitoring across a wide dynamic range.

– Technical Specifications

• Voltage Source/Monitor Range: 40 µV to ±100 V
• Current Source/Monitor Range: 20 fA to ±100 mA
• Maximum Output Power: 2 W per module
• Voltage Resolution: 40 µV minimum
• Current Resolution: 20 fA minimum
• Sourcing Modes: Constant or Pulse
• Module Slot Requirement: One slot in 4142B mainframe

– Key Features

The module incorporates an extremely stable picoammeter for sub-picoampere current measurements. One programmable voltage source functions as a ramp and staircase generator for automated parametric sweeps. Kelvin connections with separate FORCE and SENSE terminals enable remote sensing and eliminate lead resistance errors. The system supports external TTL-level triggering and stores up to 2000 program steps organized into 99 subroutines for complex test sequences. HP-IB (IEEE 488) control through the 4142B mainframe allows instrument integration into larger automated test systems.

– Typical Applications

• Semiconductor device characterization (diodes, transistors, ICs)
• Leakage current measurement in low-power devices
• I-V curve generation and analysis
• Parametric wafer testing and yield analysis
• Component reliability and burn-in testing

– Compatibility & Integration

The 41421B operates exclusively within the 4142B Modular DC Source/Monitor Mainframe, which supports up to eight plug-in modules. The mainframe provides the chassis, power distribution, and HP-IB interface for multi-module configurations. Users can build custom parametric test systems by combining different MPSMU variants and measurement modules within a single 4142B mainframe.