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The Keysight E1434A is a 4-Channel 65 kSa/sec Arbitrary Source equipped with Option ANC. This VXI module is designed for generating custom waveforms with high precision and speed. Ideal for use in electronic test and measurement systems where complex signal generation is required.
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In stock
Product Condition & Availability
Keysight / Agilent / HP E1434A 4-Channel 65 kSa/sec Arbitrary Source (w/ Option ANC) is in excellent working condition and has been thoroughly tested for performance and reliability. We offer both new and professionally refurbished options, depending on availability and customer preference.
Integrated Solutions & Deployment Support
Beyond individual products, Aumictech provides end-to-end solutions for manufacturing line deployment and test station setup. Our team can assist with system integration, configuration, and equipment selection tailored to your production requirements.
Trusted Industry Experience
With over a decade of experience, Aumictech is a recognized leader in RF and optical test equipment sales and services. All units are supported by our in-house calibration and repair facility based in Downingtown, PA, ensuring technical reliability and long-term value.
Customer Commitment
We’re committed to exceptional customer service, offering a 15-day return or replacement (ROR) policy for peace of mind. Our team is always available to assist with pre- and post-sale support.
Fast Shipping & Flexible Payments
We offer rapid global shipping through FedEx, UPS, and DHL, with most orders dispatched within 1–3 business days. Multiple secure payment options are available, including PayPal, ACH, wire transfers, and major credit cards.
The Keysight E1434A is a high-performance 4-Channel Arbitrary Source capable of generating waveforms at up to 65 kSa/sec. Featuring Option ANC, this module provides enhanced capabilities for creating intricate and precise signals. It is suitable for a variety of applications, including waveform simulation, functional testing, and signal replication in electronic design and testing environments.
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