ANRITSU MP1763B Pulse Generator 5-12 Ghz with opt 01

The Anritsu MP1763B Pulse Generator with Option 01 is a high-performance pulse pattern generator for testing high-speed digital communication systems and semiconductor devices. It operates from 50 MHz to 12.5 GHz with an internal synthesizer for clock generation, offering versatile pattern generation and precise control over signal parameters. The instrument delivers multiple output channels with variable amplitude and offset control, supporting both ECL and 50 Ω GND outputs.

– Technical Specifications

Frequency Range & Clock Generation
• Operating frequency: 50 MHz to 12.5 GHz
• Option 01 internal synthesizer: frequency settable in 1 kHz increments across the full range
• Clock delay adjustment: ±500 ps in 1 ps steps for CLOCK1 outputs

Pulse Pattern Generation
• Pattern types: Alternate (A/B switching), Programmable (up to 8 M bits, six STM-64/OC-192 frames), Zero Substitution, Pseudorandom (PRBS 2^N-1, N = 7, 9, 11, 15, 20, 23, 31)
• PRBS mark ratio: 0/8, 1/8, 1/4, 1/2, 3/4, 7/8, 8/8 selectable
• Patterns A and B must be equal length

Output Characteristics
• Output channels: Two data outputs, three clock outputs
• Signal amplitude: 0.25 Vp-p to 2 Vp-p (data and clock)
• Offset voltage: ±2 V adjustable
• Output impedance: 50 Ω
• Output levels: 50 Ω GND and ECL supported
• 1/8 speed outputs (standard): Eight data outputs at 1/8 fundamental clock frequency
• 1/4 speed outputs (Option 03): Four data and one clock output at 1/4 fundamental frequency, 0.5 to 2.0 Vp-p, rise/fall time ≤150 ps (20-80%), pattern jitter ≤15%

Waveform Quality
• Waveform distortion: ≤100 ps p-p (1/4 speed outputs)
• Rise/fall time: ≤150 ps (20-80%) for 1/4 speed outputs
• Low FM/PM-noise clock generator

– Key Features

• IEEE 488.2 GPIB interface for remote control and automated measurement
• 3.5-inch floppy disk drive for storing preset data and programs
• External clock and gating signal input connectors
• Timing I/O connector for external synchronization

– Typical Applications

High-speed digital communication testing, semiconductor device characterization, phase margin and time-dependent characteristic measurement.

– Compatibility & Integration

GPIB-enabled remote operation via external controller. Supports external clock input and gating signal control.