Keysight (Agilent) MXR104A Infiniium Oscilloscope, 1 GHz, 4 Channels

The Keysight MXR104A Infiniium Oscilloscope is a 1 GHz, 4-channel instrument built for signal analysis, design validation, and manufacturing test. It delivers 16 GSa/s sampling, 10-bit ADC resolution, and up to 400 Mpts/channel memory depth. The platform integrates optional real-time spectrum analysis, digital down conversion, logic analysis, protocol decoding, and waveform generation—collapsing multiple test instruments into a single unit.

– Technical Specifications

• Bandwidth: 1 GHz (fully upgradeable); upgradeable to 8 analog channels
• Sample Rate: 16 GSa/s analog; 8 GSa/s digital (MSO)
• Memory Depth: 400 Mpts/channel standard; 1.6 Gpts flexible configuration
• ADC Resolution: 10-bit standard; up to 16-bit in high-resolution mode
• Effective Number of Bits (ENOB): Up to 9.0
• Noise Floor: As low as 43 µV
• Rise/Fall Time: 430 ps (10–90%); 310 ps (20–80%)
• Waveform Update Rate: >200,000 wfm/s
• Amplitude Accuracy: 8 parts per billion absolute
• Digital Channels: 16 (with MSO license); 400 MHz toggle rate; configurable per-nibble thresholds
• Display: 15.6″ Full HD (1920 × 1080); external monitor extension supported

– Key Features

• Optional Real-Time Spectrum Analyzer with 40–320 MHz analysis bandwidth; 0 Hz to oscilloscope bandwidth frequency range
• Phase coherent operation across up to 8 channels with frequency extension to 6 GHz
• RF front-end: –160 dBm/Hz sensitivity, 14 dB noise figure, 108 dB dynamic range, 71 dB SFDR
• Phase noise at 1 GHz: –124.7 dBc/Hz (10 kHz offset); –126.7 dBc/Hz (100 kHz offset)
• Harmonic distortion: 2nd order –65 dBc; 3rd order –47 dBc; EVM –47 dB
• 8-in-1 instrument integration: logic analyzer, protocol analyzer, digital voltmeter, counter, spectrum analyzer, Bode plotter, waveform generator
• Over 15 math functions including FFT, differentiation, integration, and user-defined operations
• Windows 10 operating system

– Typical Applications

• Research and development signal analysis
• Design validation and compliance testing
• Manufacturing test environments
• Complex waveform characterization
• Multi-domain measurement correlation