The Tektronix TDS744A is a 4-channel digitizing oscilloscope delivering 500 MHz bandwidth with simultaneous acquisition across all channels. Purpose-built for high-speed signal capture and detailed waveform analysis, this instrument combines deep memory options, advanced triggering capabilities, and real-time measurement functions to support demanding test environments across communications, digital design, and signal integrity applications.
– Technical Specifications
Acquisition Performance
• Bandwidth: DC to 500 MHz
• Sample rate: 2 GS/s (single channel), 1 GS/s per channel (simultaneous)
• Rise time: 700 ps
• Record length: 50,000 points standard; up to 500,000 samples (one channel) with Option 1M
• Vertical sensitivity: 1 mV/div to 10 V/div
• Vertical resolution: 8-bit standard; 13-bit with Hi-Res mode; 11-bit with averaging
• DC gain accuracy: ±1.0%
• Measurement accuracy (single shot): 100:1 @ 100 MHz; >30:1 @ bandwidth
• Inter-channel delay: 400,000 wfm/sec (InstaVu); 150 wfm/sec (infinite persistence)
Display & Interface
• 7-inch NuColor™ liquid crystal full-color shutter (256 levels)
• Variable persistence with color grading and infinite persistence mode
• VGA output to external monitor
Measurement & Analysis
• 25 automatic measurements (entire record or gated region)
• Cursor measurements: absolute and delta in volts, time, frequency
• Advanced functions: FFT, Integration, Differentiation, Limit Testing
• Arithmetic operations: Add, Subtract, Multiply, Divide, Invert
Triggering
• Main trigger modes: Auto, Normal, Single
• Edge, Pulse (Width, 1 ns Glitch, Runt, Slew Rate), Logic (Pattern, State, Setup & Hold), and optional Video triggering
– Typical Applications
High-speed digital circuit characterization, signal integrity analysis, power electronics measurement, and protocol validation requiring multi-channel simultaneous acquisition with sub-nanosecond timing resolution.
– Compatibility & Integration
External VGA monitor support. Optional 1M record length expansion and video trigger capability enhance measurement flexibility across specialized applications.
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