The Tektronix TLA704 is a portable logic analyzer mainframe that combines state and timing acquisition in a single instrument platform. It captures digital signals at up to 200 MHz state rate with simultaneous 2 GHz timing resolution across all channels via MagniVu™ technology, delivering 500 ps timing accuracy. The expansion mainframe architecture accommodates up to 16 modules, scaling to 2,176 logic analyzer channels, 1,024 pattern generator channels, or 64 digitizing oscilloscope channels for multi-processor system analysis. Users configure the instrument with modular acquisition and stimulus cards to meet application-specific requirements—logic analysis, digital storage oscilloscopy, or combined operation.
– Technical Specifications
• MagniVu™ Acquisition: 500 ps timing resolution across all channels
• State Acquisition: 200 MHz with 400 MHz data rate
• Timing Acquisition: 2 GHz resolution
• Data Depth: 16 Mbits per channel
• Channel Capacity: Up to 2,176 logic analyzer channels; 1,024 pattern generator channels; 64 digitizing oscilloscope channels
• Pattern Generator: 64 channels at 268 MHz maximum frequency, 2 MB memory depth
• Oscilloscope Module: Four channels, 1 GHz bandwidth, 5 GS/s sampling rate
• Operating System: Microsoft Windows 95; Windows 2000 Professional supported on later software versions
• Processor Architecture: PC-based processor
– Key Features
• Simultaneous state and timing analysis through single probe
• Hardware-accelerated waveform display and search across large datasets
• Universal HLL source code correlation for real-time trace analysis
• Performance analysis and optimization support
• Remote control via Microsoft COM/DCOM technology
• Modular design for flexible instrument configuration
– Typical Applications
• Complex digital system debugging and timing fault isolation
• Multi-processor board and bus analysis
• Functional verification and stress testing via pattern generation
• High-fidelity signal quality measurement
– Compatibility & Integration
Windows 95 environment with standard PC I/O connectivity. Supports integration with external systems through COM/DCOM interfaces for automated test and data analysis workflows.



























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