The Advantest Q8155 is a tunable semiconductor laser source engineered for wavelength-selective optical testing and photonics characterization. It delivers narrowband, stable light output with continuous wavelength tuning across its operating spectrum. The instrument supports rapid spectral switching and adjustable power control, making it suitable for component analysis, fiber optic measurements, and WDM system evaluation where precise wavelength selection and output stability are critical.
– Technical Specifications
Light Source
• Tunable semiconductor laser
Spectral Output
• Narrowband linewidth enabling high spectral resolution
• Single-mode or multi-mode operation depending on configuration
• Continuous wavelength tuning capability
• Adjustable output power for precise measurement scenarios
Stability Performance
• High power stability across time and temperature variations
• Excellent wavelength stability ensuring consistent spectral output
Tuning Characteristics
• Fast tuning speed facilitating efficient test sequences
Control Interfaces
• Local on-board control panel with parameter display
• GPIB and/or Ethernet remote control for automated system integration
• External software compatibility for advanced automation and scripting
Optical Output
• Standard optical connector (specific type varies by configuration)
– Key Features
• Rapid wavelength switching for dynamic test applications
• Dual-mode operation flexibility
• Temperature-compensated output stability
• Multi-protocol remote control supporting laboratory automation
– Typical Applications
• Optical component characterization and validation
• Fiber optic system testing
• Dense wavelength division multiplexing (WDM) system analysis
• Photonics research and optical network development
– Compatibility & Integration
The Q8155 integrates into automated test environments via GPIB or Ethernet connectivity. Local control through the display panel supports manual operation and parameter verification. External software platforms enable advanced scripting for complex measurement sequences.
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