ADVANTEST Q8381A Optical Spectrum Analyzer 350-1750nm same AQ6315E CALIBRATED

The Advantest Q8381A is a benchtop optical spectrum analyzer delivering precise spectral characterization across the 350 nm to 1750 nm range. This instrument combines wide wavelength coverage spanning UV through NIR with dynamic range exceeding 40 dB, making it suitable for telecommunications, fiber optics, optical component testing, and research applications. The Q8381A provides wavelength accuracy of ±0.5 nm at 23 ± 5 °C and level accuracy of ±1.5 dB or less, supported by selectable resolution from 0.1 nm to 5.0 nm. Automated functions including peak search, half-value width measurement, and pulse light detection streamline measurement workflows. High-speed sweep capability delivers sub-second acquisition across 200 nm spans. A built-in thermal printer records results in 10 seconds or less, while GP-IB interface enables remote operation and data transfer.

– Technical Specifications

• Wavelength Range: 350 nm to 1750 nm
• Wavelength Accuracy: ±0.5 nm (at 23 ± 5 °C); ±1.0 nm (at 10 to 40 °C)
• Wavelength Repeatability: 0.1 nm or less (one-minute repetitive sweep)
• Wavelength Resolution: 0.1 nm, 0.2 nm, 0.5 nm, 1.0 nm, 2.0 nm, 5.0 nm
• Dynamic Range: 40 dB or more (±1 nm from peak); input sensitivity -85 dBm; typical range -85 dB to +10 dBm (1.1–1.6 µm)
• Level Accuracy: ±1.5 dB or less (0.633 µm, 1.31 µm, 1.55 µm)
• Level Linearity: ±0.5 dB/20 dB, ±1.0 dB/40 dB, ±0.5 dB/10 dB, ±1.0 dB/40 dB
• Polarization Dependency: ±0.1 dB or less
• Sweep Time: 0.8 seconds or less (200 nm span); 1.0 second or less (50 nm span)

– Key Features

• Automatic optimum measurement condition setting and peak search
• Half-value width measurement function
• Pulse light measurement capability with low-level data retention
• Power monitoring and luminosity compensation display
• Built-in thermal printer (10 seconds or less per print)
• GP-IB interface for remote control and data output

– Typical Applications

• Telecommunications system testing
• Fiber optics characterization
• Optical component and device validation
• Display LED measurements
• Research and development

– Compatibility & Integration

• GP-IB remote interface standard
• Benchtop form factor