The Advantest R3271A Spectrum Analyzer covers 100 Hz to 26.5 GHz and delivers high-performance RF and microwave signal analysis across research, development, and production environments. With Option 21 precision reference installed, this instrument provides exceptional timebase stability and accuracy for demanding telecommunications, radar, and satellite communications measurements. The R3271A combines spectrum analysis, modulation demodulation, occupied bandwidth computation, and multi-marker signal characterization in a single platform.
– Technical Specifications
Frequency Range: 100 Hz to 26.5 GHz
Amplitude Measurement: -150 dBm to +30 dBm, with ±0.5 dB accuracy
Resolution Bandwidth: 1 Hz to 3 MHz (1-3-10 sequence); optional 10 Hz to 3 MHz
Video Bandwidth: 1 Hz to 3 MHz (1-3-10 sequence)
Displayed Average Noise Level (DANL): -145 dBm typical
Phase Noise: -90 dBc/Hz at 10 kHz offset; -100 dBc/Hz at 10 kHz offset
Signal Purity: -110 dBc/Hz at 10 kHz offset for frequencies below 2.6 GHz
Dynamic Range: 70 dB typical for adjacent channel leakage power; up to 150 dB dynamic range down to -140 dBm
Input Impedance: 50 Ω nominal
VSWR: <1.5:1 for ≤3.6 GHz (attenuator ≥10 dB)
– Key Features
• Option 21 crystal oscillator with 5 × 10⁻⁹/day stability for enhanced timebase accuracy
• Pulse RF signal analysis for radar and microwave applications
• Occupied bandwidth and adjacent channel leakage power measurement with PDC/NADC-compliant Nyquist filtering
• AM and FM demodulation with speaker and phone jack audio output
• Built-in frequency counter with 1 Hz resolution
• Average power measurement with measuring window and power density analysis
• Delayed and gated sweep modes for time-domain signal examination
• Multi-marker function supporting up to 8 analysis points
• BASIC controller for automated measurement construction and data storage
• Memory card function for data archiving
– Typical Applications
Spectrum analysis of radar pulse signals, satellite broadcasting and communications, mobile communication systems, and spurious emission characterization across wide dynamic ranges.
– Compatibility & Integration
Integrated BASIC controller enables system integration and automated test sequence development. Memory card support facilitates data portability and long-term archiving.
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