Advantest R3752XH – Network analyzer

The Advantest R3752XH is a network analyzer engineered for precise characterization of electronic components and networks across DC to microwave frequencies. It delivers simultaneous multi-parameter measurement with 16 independent channels and display windows, supporting 2-port, 3-port, and 4-port device configurations. The instrument combines high measurement speed—0.1 ms per point at 10 kHz resolution bandwidth—with 115 dB dynamic range, enabling rapid device qualification in R&D, manufacturing, and quality assurance environments.

– Technical Specifications

• Frequency Range: 5 Hz to 500 MHz
• Measurement Channels: 16 independent channels
• Display Windows: 16 simultaneous windows
• Traces per Channel: 16 traces with concurrent display capability
• Dynamic Range: 115 dB
• Measurement Speed: 0.1 ms per point (10 kHz RBW)
• S-Parameter Support: 2-port (S11, S21, S12, S22), 3-port, and 4-port configurations
• Parameter Conversion: Impedance (Z) and admittance (Y) conversion available
• Output Power (R3752 Series): +21 dBm to –63 dBm

– Key Features

• Multi-format display: rectangular coordinates, Smith Chart, and polar coordinates with marker readout in linear/logarithmic amplitude, phase, and complex notation
• VSWR, group-delay, and complex impedance (R + jX, G + jB) measurement modes
• Parallel measurement capability: simultaneous testing of two devices with 4-trace display
• Flexible frequency segmentation with programmable resolution bandwidth per sweep segment
• Input signal processing via dual-mixer heterodyne architecture (1st IF: 820 kHz, 2nd IF: 20 kHz)

– Typical Applications

• Component characterization and impedance profiling
• Filter and transmission-line measurement
• Reflection coefficient and VSWR analysis
• Device qualification for RF/microwave circuits

– Compatibility & Integration

The R3752XH architecture supports external signal processing and multi-port test configurations, enabling integration into automated test systems and manufacturing environments requiring high-throughput parametric analysis.