The Advantest R3753XH is a high-performance network analyzer engineered for vector characterization of electronic networks across 2-port, 3-port, and 4-port device configurations. It delivers S-parameter measurements with simultaneous 2-channel 4-trace capability and supports parameter conversion to impedance (Z) and admittance (Y) formats, making it essential for RF device development, component qualification, and manufacturing test environments.
– Technical Specifications
• Frequency Range: 5 Hz to 500 MHz (Model R3753AH/BH)
• Frequency Setup Resolution: 1 Hz
• Frequency Accuracy: ±10 ppm (at 23 ±5°C)
• Temperature Stability: ±15 ppm (5 to 40°C, Typical)
• Long-term Stability: ±3 ppm/year (Typical)
• Measurement Channels: 16 independent channels
• Display Windows: 16 simultaneous display windows
• Traces per Channel: 16 traces (maximum 16 simultaneous)
• Dynamic Range: 115 dB wide dynamic range; 100 dB measurement dynamic range (system: ~8 averages, 10 Hz RBW typical)
• Sweep Time: 0.1 ms/point minimum; high-speed 2-channel 4-trace at 0.1 ms/point (10 kHz RBW); 0.15 ms/point normalized calibration or 0.25 ms/point 2-port full calibration
– Key Features
• Measurement Formats: Rectangular (amplitude linear/log, phase, group-delay, VSWR, complex), Smith chart, and polar coordinate displays with marker readouts
• Programmed Sweep: Free variation of resolution bandwidth and output level at any sweep point
• High-Speed Level Sweep: Semiconductor output switch enables rapid drive-level performance characterization
• Limit Line Testing: PASS/FAIL judgment with user-selectable color specification for limits and waveform data
• Simultaneous Multi-Device Measurement: Type A models support concurrent 2-device measurement via S-parameter test set connection
– Typical Applications
RF component characterization, filter tuning, amplifier gain/phase measurement, impedance matching network design, and high-volume manufacturing test.
– Compatibility & Integration
S-parameter test set connection enables simultaneous dual-device measurement on Type A configurations.
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