The Advantest R3767CG is a vector network analyzer engineered for S-parameter characterization, impedance measurement, and multi-port device testing from 300 kHz to 8 GHz. The instrument delivers sweep times as short as 150 µs/point and supports forward/reverse S-parameter acquisition with a built-in test set. Its 50 Ohm output can be controlled across a +10 dBm to −10 dBm range with 0.01 dB resolution, enabling precision power management for diverse RF and microwave applications.
– Technical Specifications
• Frequency range: 300 kHz to 8 GHz
• Output impedance: 50 Ohms
• Output power range: +10 dBm to −10 dBm
• Power resolution: 0.01 dB
• Minimum sweep time: 150 µs/point
• High-speed sweep time: 0.15 ms/point (2-port full calibration)
• Display: 8.4-inch color TFT with four-window capability
• Dimensions: 424 mm (W) × 220 mm (H) × 400 mm (D)
• Weight: ≤18.5 kg
– Key Features
• Simultaneous display of up to eight parameters across four independent measurement paths
• Built-in S-parameter test set for bidirectional measurements
• Optional 3-port (Option 11) or 4-port (Option 14) test sets for multi-port characterization
• Time domain analysis function (Option 70) for reflection response mapping
• Software fixture option (71/72) enabling impedance conversion and balanced circuit analysis without external hardware
• Step attenuator (Option 10) for output level precision
• BASIC controller function integrated for automated measurement sequencing
• Optional LAN interface for remote control and data transfer
– Typical Applications
Component and system S-parameter characterization across microwave frequencies; impedance profiling; multi-port device qualification; time domain reflectometry and impulse response analysis.
– Compatibility & Integration
Supports MS-DOS PC connectivity via FD drive for data analysis. Optional LAN interface available for networked operation.


















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