Advantest R6243

The Advantest R6243 is a DC voltage and current source/monitor engineered for precision testing of electronic components and circuits. It delivers simultaneous sourcing and measurement across wide voltage (0 to ±110V) and current (0 to ±2A) ranges, with resolution down to 1µV and 100pA. Built for R&D characterization and production-line testing, the R6243 combines high source accuracy (4½-digit resolution) with measurement precision (5½-digit resolution) and flexible sweep capabilities for demanding device evaluation.

– Technical Specifications

Output and Measurement Ranges
• Voltage source/measurement: 0 to ±110V
• Current source/measurement: 0 to ±2A (voltage-dependent compliance)
– ±2A maximum at up to 32V compliance
– ±1A maximum at up to 64V compliance
– ±0.5A maximum at up to 110V compliance
• Voltage measurement range: 320mV to 110V
• Current measurement range: 32µA to 2A

Resolution & Accuracy
• Voltage source resolution: 10µV (4½-digit)
• Voltage measurement resolution: 1µV (5½-digit)
• Current source resolution: 1nA (4½-digit)
• Current measurement resolution: 100pA (5½-digit)
• Source linearity: ±0.01% of range
• Line regulation: ±0.003% of range
• Accuracy guaranteed for one year at 23±5°C, ≤85% RH

– Key Features

• Linear, logarithmic, and random sweep functions for device characterization
• Pulse measurement and current pulse sweep (ISVM) with 1ms minimum pulse width
• Simultaneous Id and Ig measurement capability
• Synchronized multi-unit operation (two or more R6243/6244 units)
• Drain and gate voltage generation timing control for device stress mitigation
• Oscillation, overload, and overheat detection
• Limiter (compliance) function with sink capability up to ±20A at 7V
• Constant-current and constant-voltage battery charge/discharge testing via DC or pulse
• Bipolar sink-enabled output with measurement delay and source delay timing functions

– Typical Applications

Device characterization in R&D; production-line parameter testing; semiconductor component evaluation; battery test protocols; transistor and diode characterization under dynamic and DC conditions.

– Compatibility & Integration

Multiple R6243 and R6244 units synchronize for coordinated multi-channel testing with trigger and output “complete” signaling.