The Advantest R6551 is a precision digital multimeter engineered for high-resolution measurement and automated test system integration. With a 5½ digit display (maximum reading 319999) and 3 ppm resolution, it delivers DC voltage, AC voltage (true RMS), resistance (two-wire and four-wire), DC current, AC current (true RMS), frequency, and continuity measurements across wide ranges. DC voltage measurements span 0.03 V to 1000 V with 1 µV minimum resolution. AC voltage covers 300 mV to 700 V across 20 Hz to 300 kHz. Current measurements reach 3 A maximum on both DC and AC circuits with 1 µA resolution. Resistance measurements utilize a four-wire system across seven ranges from 300 Ω to 300 MΩ, minimizing cable resistance effects.
– Technical Specifications
• Display: 5½ digits with 319999 maximum reading; 3 ppm resolution
• DC Voltage Accuracy: 0.015% (1-year basic)
• AC Voltage Accuracy: 1.1% (1-year basic); frequency band 20 Hz to 300 kHz
• DC Current Accuracy: 0.13% (1-year basic)
• AC Current Accuracy: 2% (1-year basic)
• Resistance Accuracy: 2% (1-year basic); seven ranges, 300 Ω to 300 MΩ
• Frequency Accuracy: 2%
• Sampling Rate: 100 pt/sec (up to 4½ digit display)
• Integration Time: User-selectable for stable measurements
– Key Features
• NULL operation for offset correction and relative value measurement
• SCALE operation for ratio display
• External trigger input with measurement end signal output
• High-speed auto-ranging
• Setting storage for panel configurations
• GPIB calibration without case opening
• Standard GPIB interface for test system automation
• Optional BCD parallel data output
– Typical Applications
Precision electrical characterization in R&D and manufacturing environments; automated test systems requiring high-speed data acquisition; component verification and in-circuit diagnostics; frequency and resistance measurements in production test.
– Compatibility & Integration
Standard GPIB connectivity enables seamless integration into ATE platforms. External trigger and measurement end signal connectors support synchronization with multi-instrument test sequences. Optional BCD parallel output provides alternative data path for legacy systems.
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