The Advantest R8340A Ultra-High Resistance Meter is a precision instrument for measuring extremely high resistance values and micro currents across 16 decades. It combines an input amplifier gain-switching I-V converter, high-speed sampling A/D converter, and low-noise voltage generation to enable sensitive detection of ion currents, leakage currents, and insulation material characterization. The meter measures resistance from 10 Ω to 3 × 10¹⁶ Ω and current from 10 fA to 19.999 mA, with sampling rates up to 100 samples per second.
– Technical Specifications
Measurement Range
• Resistance: 10 Ω to 3 × 10¹⁶ Ω
• Current: 10 fA to 19.999 mA
Voltage Source
• DC supply: 0.000 V to 1000.0 V continuously variable
• Floating measurement capability: Up to 1100 VDC
• Voltage generator: 5 mVp-p noise @ 1000 V, 3 ms rise time (0 to 1000 V), 10 W class
• Source/sink capability with selectable current limits
Measurement Performance
• Sampling rate: Up to 100 samples per second
• Input amplifier gain switching for adjustable measurement speed and accuracy
• Automatic range level selection: 20000, 2000, or 200 (UP mode); 1799, 179, or 17 (DOWN mode)
Data Storage & Output
• Memory capacity: 1000 data items
• Sequence program function with stored measurement conditions
• GPIB interface (IEEE 488-1978) with packed format output support
• BCD output format
• D/A output: ±1 V with ±50% offset adjustment
– Key Features
• Programmable measurement sequences including JIS C5102 procedures
• Contact check function via capacitance measurement
• Rapid sample charging and discharging with source/sink capability
• Low-noise, high-response voltage generation
• Configurable input resistance and integration time
– Typical Applications
• Insulation material characterization
• Switch and connector testing
• Capacitor evaluation
• Ion current and leakage current detection
• Quality control and production testing
• Research and development
– Compatibility & Integration
• Handler interface for external devices and automated fixtures
• GPIB connectivity for test system integration and production line automation
• Incoming inspection and high-volume testing support via packed data format output
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