Agilent 33250A Arbitrary Waveform Generator

The Agilent 33250A Arbitrary Waveform Generator is a direct digital synthesis (DDS) signal source capable of generating standard waveforms, arbitrary waveforms, and complex modulated signals up to 80 MHz. It delivers stable, accurate outputs with 1 µHz frequency resolution and enables precise component characterization, sensor simulation, signal conditioning, and general R&D tasks across educational and professional environments.

– Technical Specifications

Waveform Generation

• Standard waveforms: Sine, Square, Ramp, Triangle, Noise, Sin(x)/x, Exponential Rise, Exponential Fall, Negative Ramp, Cardiac, DC Volts
• Arbitrary waveforms: 1 to 64K points, 12-bit vertical resolution, 200 MSa/s sample rate
• Non-volatile storage for up to four 64K-point arbitrary waveforms
• Pulse generation to 50 MHz with edge time from 5.00 ns to 1.00 ms and pulse width from 8.0 ns to 1999.9 s
• Modulation: AM, FM, FSK with internal or external sources and 0.0% to 120.0% depth
• Sweep modes: Linear or logarithmic from 1 µHz to 80 MHz with programmable frequency marker
• Burst mode: Triggered or gated output with programmable count, phase, and period

Output Characteristics

• Amplitude: 10 mVpp to 10 Vpp into 50 Ω; 20 Vpp into high impedance
• Amplitude accuracy at 1 kHz: ± 1% of setting ± 1 mVpp
• Offset: ± 5 Vpk ac + dc into 50 Ω; accuracy 1% of setting + 2 mV + 0.5% of amplitude
• Output impedance: 50 Ω typical (fixed)
• Isolation: 42 Vpk maximum to Earth
• Short-circuit protection with overload relay

Frequency & Harmonic Performance

• Sine/square output: Up to 80 MHz
• Frequency stability (TCXO): 2 ppm (18°C to 28°C); 3 ppm (0°C to 55°C)
• Harmonic distortion (sine): Up to -60 dBc at 1 MHz
• Spectral purity (sine): Up to -60 dBc at 1 MHz
• Sine flatness relative to 1 kHz: < 10 MHz ± 1% (0.1 dB); 10–50 MHz ± 2% (0.2 dB); 50–80 MHz ± 5% (0.4 dB)

Square Wave Performance

• Rise/fall time: < 8 ns
• Overshoot: < 5%
• Asymmetry: 1% of period + 1 ns
• Jitter: 2 MHz: 0.1% + 75 ps

– Key Features

• Arbitrary waveform storage with user-defined naming
• 200 MSa/s sampling supports complex signal generation
• Multiple modulation formats for advanced testing
• Programmable sweep and burst modes for dynamic signal variation

– Typical Applications

• Component and device characterization
• Sensor simulation and stimulus
• Signal conditioning and filtering validation
• Research and development testing

– Compatibility & Integration

• 50 Ω output impedance for standard RF/microwave test configurations
• TCXO timebase ensures frequency stability across operational temperature range
• Overload protection suitable for unattended operation