Agilent 8712ET RF Network Analyzer 300 kHz-1300 MHz w 1E1

The Agilent 8712ET RF Network Analyzer operates from 300 kHz to 1300 MHz and delivers transmission and reflection measurements for RF component and circuit manufacturing. It features three independent receivers with >100 dB dynamic range in narrowband-detection mode, a synthesized source with 1 Hz resolution and 40 ms sweep capability, and vector-error-correction techniques for improved accuracy. Option 1E1 adds a 60 dB step attenuator, extending source output power control from +16 dBm down to -60 dBm—essential for active device testing across wide dynamic ranges.

– Technical Specifications

• Frequency Range: 300 kHz to 1300 MHz
• Source: Synthesized, 1 Hz resolution; 40 ms sweep time (or faster)
• Output Power: +16 dBm nominal; –60 dBm to +16 dBm with Option 1E1
• Receivers: Three independent; narrowband and broadband detection modes
• Dynamic Range: >100 dB (narrowband mode)
• Output Power Accuracy: ±1.0 dB (without attenuator); ±2.0 dB (with Option 1E1)
• Harmonics: <–20 dBc (<1 MHz); 1 MHz)
• Phase Noise: <–67 dBc/Hz at 10 kHz offset
• Residual AM: <–50 dBc (100 kHz bandwidth)
• Residual FM: <1.5 kHz peak (30 Hz to 15 kHz)
• Frequency Stability: ±5 ppm (0° to 55° C typical); ±5 ppm CW accuracy (25° ±5° C)
• Impedance: 50-ohm and 75-ohm configurations

– Key Features

• Dual parameter simultaneous display in rectangular, polar, and Smith chart formats
• Large display with external VGA monitor output support
• Vector-error-correction calibration techniques
• Internal factory calibration and external standards support
• LAN interface with GPIB, serial, and parallel connectivity

– Typical Applications

• High-volume RF component manufacturing and characterization
• Active device testing across extended power ranges
• Component S-parameter and impedance measurement

– Compatibility & Integration

Programmable via Keysight Instrument BASIC (IBASIC); code compatible with earlier 8712 family models. Supports automated test environments and external control via standard instrumentation interfaces.