Agilent/HP 3437A System Voltmeter

The Agilent/HP 3437A System Voltmeter is a microprocessor-controlled, 3.5-digit instrument engineered for automated computer-controlled measurement systems. It delivers sampling rates up to 5700 samples per second, enabling fast data acquisition and repetitive-waveform analysis across three selectable voltage ranges: 0.1 V, 1.0 V, and 10.0 V. The instrument provides 100% overranging on all ranges, supporting floating measurements up to ±20 V from DC through 1.0 MHz.

Chasis-isolated input terminals with triaxial BNC connectors ensure high-impedance measurements. The wideband input amplifier incorporates auto-zero, auto-polarity, and sample-and-hold capabilities for instantaneous voltage capture. Input impedance on the 10 V range is 1 MΩ with <75 pF capacitance; the 1 V and 0.1 V ranges exceed 10⁸ Ω. Common-mode rejection reaches 75 dB at 60 Hz with 1 kΩ unbalance in the low input lead.

– Technical Specifications

• Display: 3.5-digit with maximum reading of 1998
• Voltage Ranges: 0.1 V, 1.0 V, 10.0 V (DC floating)
• Overrange: 100% on all ranges (±20 V capability)
• Frequency Range: DC to 1.0 MHz
• Sampling Rate: Up to 5700 samples per second (Packed format)
• Trigger Capability: 1 Hz to 5700 Hz; up to 9999 triggers per received event
• Trigger Delay: 0 to 1 second in 100 ns increments
• Sample Count: Programmable 0 to 9999 samples per trigger
• Input Connector: Triaxial BNC
• CMRR: 75 dB at 60 Hz
• Interface: HP-IB with ASCII (8-byte) and Packed (2-byte) data formats

– Key Features

• Sample-and-hold for instantaneous readings
• Configurable trigger delay in 100 ns steps
• Burst sampling to 9999 triggers per event
• Operating temperature: 0 °C to 50 °C
• Storage temperature: -40 °C to 75 °C
• Power consumption: ≤42 VA
• Selectable input voltage: 100 V, 120 V, 220 V, 240 V (±5% to -10%, 48–440 Hz)

– Typical Applications

• Fast multipoint data-acquisition
• Repetitive-waveform analysis
• Low-frequency transient characterization
• Low-frequency True RMS measurements
• Automated test systems
• Electronic validation processes

– Compatibility & Integration

Full programmability via HP-IB interface with optional Binary Program mode for abbreviated code programming. Data output in ASCII or Packed formats supports integration into automated test environments.