The Agilent/Keysight 10441A is a 10:1 passive probe engineered for general-purpose oscilloscope measurements across a wide frequency range. Operating from DC to 500 MHz with 1 MΩ input impedance, this probe delivers accurate signal acquisition for development and manufacturing test environments. Its narrow, sharp probe tip excels at probing surface-mount components, while a retractable hook tip accommodates conventional IC and circuit node measurements.
– Technical Specifications
• Division Ratio: 10:1
• Bandwidth: DC to 500 MHz
• Input Resistance: 1 MΩ (at probe tip with 1 MΩ scope input)
• Input Capacitance: 9.0 pF to 9.5 pF (with 1 MΩ scope input)
• Compensation Range: 6 pF to 25 pF oscilloscope input capacitance
• Maximum Input Voltage: 500 V RMS (CAT I and CAT II)
• Cable Length: 2 meters (6.6 feet)
• Connector Type: BNC
• Weight: Approximately 65 grams
– Key Features
• Modular design permits individual replacement of probe tips, cables, and chassis assemblies, reducing service costs and downtime
• Integrated probe ID pin enables automatic oscilloscope recognition on compatible Agilent/Keysight instruments
• Ground clip with ferrite bead minimizes high-frequency noise
• Four grounding spanners supplied for optimized high-frequency measurements
• Barrel insulator prevents accidental signal shorting during operation
• Adjustment tool included for capacitive compensation tuning
• Color-coding rings for circuit identification
– Typical Applications
General-purpose signal acquisition in analog and digital circuits. Surface-mount device (SMT) probing in PCB development and manufacturing. IC pin measurements at 0.1 inch pitch. Mixed-signal troubleshooting where passive 10:1 attenuation and high input impedance preserve circuit loading characteristics.
– Compatibility & Integration
Designed for oscilloscopes with 1 MΩ input impedance. Supports scope input capacitance from 6 pF to 25 pF. Probe ID pin provides automatic probe recognition on compatible Agilent/Keysight oscilloscope platforms. Includes general-purpose grabber and integrated circuit grabber accessories for flexible test point access.
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