Agilent/Keysight 16505A

The Agilent/Keysight 16505A is a prototype analyzer accessory for compatible Agilent/Keysight logic analysis systems, designed to accelerate digital circuit debugging through multi-domain data visualization and correlation. It enables simultaneous viewing of measurement data across waveform, listing, chart, and statistical distribution modes, facilitating rapid identification of cross-domain cause-and-effect relationships.

– Technical Specifications

• Display resolution up to 1024 x 768 pixels; 1280 x 1024 pixels with Option 001 (additional video RAM and compatible monitor)
• Supports up to 100 individual waveforms displayed simultaneously
• Two local and two global markers for time correlation across all displays
• Built-in 1.44 MB floppy disk drive for removable media storage
• Internal hard disk drive for data retention

– Key Features

• Dynamic window resizing for waveform, histogram, and chart displays with automatic rescaling
• Individually sized and colored timing and analog waveforms
• Resizable state listing windows with variable text size and dynamic system label reordering
• Symbolic information support via OMF file formats for trigger conditions and trace listings
• Code offset capability for dynamically loaded PC-relative code
• Cross-domain data correlation—multiple instruments transmit data to single display windows
• Interactive toolbox with drag-and-drop measurement, analysis, and display tools
• Mouse and keyboard input devices included

– Analysis and Measurement Capabilities

• Simultaneous source, trace, and waveform display for parallel cross-domain tracking
• Multiple visualization modes: waveform, listing, chart, and statistical distribution
• Cross-domain triggering via associated HP 16500C logic analysis system
• Symbol name integration from source code (functions, variables) into analysis workflows

– Compatibility & Integration

The 16505A functions as an accessory to compatible Agilent/Keysight logic analysis systems, enabling enhanced multi-instrument data correlation and centralized display management for complex digital system analysis.