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Agilent/Keysight 4140B

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The Agilent/Keysight 4140B is a versatile Semiconductor Parameter Analyzer designed for comprehensive DC characterization of semiconductor devices and materials. It provides accurate measurement and analysis of voltage, current, and resistance parameters, enabling engineers and researchers to evaluate device performance, extract model parameters, and ensure quality control in semiconductor manufacturing.

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Precision RF and optical test equipment sales, calibration, and repair by Aumictech. Email: sales@aumictech.com

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Equipment info

The Agilent/Keysight 4140B is a semiconductor parameter analyzer for DC characterization of devices and materials. It delivers picoampere-level current measurement, synchronized I-V analysis, and quasi-static C-V capability. Two programmable DC voltage sources enable flexible DC, ramp, and staircase stimulus patterns with independent current limiting. HP-IB interface supports remote operation and high-speed data streaming for integration into automated test systems.

– Technical Specifications

Current Measurement
• 11 ranges from ±0.001 pA to 10 mA full scale with 10 fA resolution
• 99.9% overrange on all ranges

Voltage Sources
• Two programmable DC sources: −100 V to +100 V, 10 mV resolution
• One source generates DC, ramp (1 mV/s to 1 V/s), or staircase patterns
• Second source provides stable DC bias
• Programmable current limits: 10⁻⁴ A, 10⁻³ A, 10⁻² A

Capacitance Measurement
• Quasi-static C-V from voltage ramp: 0.1 pF to 1999 pF
• Two measurement ranges: 0.0−100.0 pF and 200−1000 pF full scale with 99.9% overrange
• %C display (0.0% to 199.9% of oxide capacitance)

Measurement Performance
• Measurement interval: 4 ms to 2.56 s
• Selectable integration times (short, medium, long) for speed/accuracy trade-off
• Zero offset cancellation: 100 fA (leads/fixtures), 100 pF (C-V mode)
• Line filter for picoampere measurements in noisy environments

– Key Features

• Synchronized I-V and quasi-static C-V characterization
• Flexible sweep control with AUTO/START, MAN (PAUSE), STEP, ABORT modes
• Analog outputs for X-Y recorder plotting (I-V, C-V, pen control, limit voltages)
• External, internal, and HOLD/MAN trigger options
• Automatic self-test of digital and analog circuits
• High-speed HP-IB data output at 4 ms intervals

– Typical Applications

• Semiconductor device characterization and model parameter extraction
• MOS transistor and diode DC analysis
• Leakage current and capacitance measurement
• Quality control and reliability screening in manufacturing

– Compatibility & Integration

HP-IB (IEEE 488) interface supports SH1, AH1, T5, L4, SR1, RL1, DC1, DT1 capabilities for system integration, remote programming, and automated data acquisition.

MPN

4140B

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Product Condition & Availability
Agilent/Keysight 4140B is in excellent working condition and has been thoroughly tested for performance and reliability. We offer both new and professionally refurbished options, depending on availability and customer preference.

 

Integrated Solutions & Deployment Support
Beyond individual products, Aumictech provides end-to-end solutions for manufacturing line deployment and test station setup. Our team can assist with system integration, configuration, and equipment selection tailored to your production requirements.

Trusted Industry Experience
With over a decade of experience, Aumictech is a recognized leader in RF and optical test equipment sales and services. All units are supported by our in-house calibration and repair facility based in Downingtown, PA, ensuring technical reliability and long-term value.

Customer Commitment
We’re committed to exceptional customer service, offering a 15-day return or replacement (ROR) policy for peace of mind. Our team is always available to assist with pre- and post-sale support.

Fast Shipping & Flexible Payments
We offer rapid global shipping through FedEx, UPS, and DHL, with most orders dispatched within 1–3 business days. Multiple secure payment options are available, including PayPal, ACH, wire transfers, and major credit cards.

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