Agilent/Keysight 4195A

The Agilent/Keysight 4195A is a dual-function vector network analyzer and spectrum analyzer operating from 10 Hz to 500 MHz. It delivers simultaneous network and spectral characterization in a single instrument, making it suitable for component and circuit validation across audio, baseband, HF, VHF, and IF applications.

– Technical Specifications

Network Analysis
• Frequency range: 10 Hz to 500 MHz
• Source power: –50 dBm to +15 dBm with 0.1 dB resolution
• Two outputs with selectable sweep modes (linear, log, CW, program, partial)
• DC bias capability: ±40 V, 10 mV resolution
• Four 50 Ω receiver inputs
• Magnitude ratio dynamic range: > 100 dB; resolution 0.001 dB; accuracy ±0.05 dB (–70 to –30 dBm test input, –30 dBm reference input)
• Phase measurement: ±180° range, 0.01° resolution, ±0.3° accuracy (–70 to –30 dBm)
• Delay measurement: 10 ps to 500 s range; 10 ps resolution at 3.6 MHz aperture
• Calibration modes: normalization, 1-port partial, 1-port full, and port extension

Spectrum Analysis
• Frequency range: 10 Hz to 500 MHz
• Resolution bandwidth: 3 Hz to 300 kHz (1-3-10 steps)
• Amplitude range: –135 dBm to +20 dBm
• Amplitude accuracy: ±1.0 dB at 50 MHz
• Average noise level: typically –140 dBm at 10 Hz RBW, ≥2 MHz
• Second harmonic distortion: ≤ –70 dBc at ≥2 MHz
• Third-order intercept distortion: ≤ –80 dBc at ≥2 MHz
• Frequency response: ±1.5 dB
• Sweep time: approximately 500 ms/span to 1800 s/span; 3.5 s typical at 500 MHz span, 300 kHz RBW

– Key Features

• Color CRT display for multi-trace differentiation
• Softkey operation and marker functions
• User-programmable functions with 3.5-inch disk drive storage
• Frequency resolution to 1 mHz
• Multiple sweep modes and manual control

– Typical Applications

Component characterization, impedance measurement, filter analysis, amplifier validation, and spectral content assessment in research, development, and manufacturing environments.

– Compatibility & Integration

The 4195A accepts external programming and supports user-defined measurements through internal function libraries.