Agilent/Keysight 8509B

The Agilent/Keysight 8509B is a lightwave polarization analyzer system for calibrated measurements of optical signal polarization states and component behavior across the 1200–1600 nm band. The instrument employs a four-diode detection scheme with integrated polarization generation and reference calibration to deliver accurate SOP, Stokes parameter, PDL, and PMD characterization at measurement rates exceeding 2000 per second.

– Technical Specifications

Optical Performance
• Wavelength operating range: 1200 nm to 1600 nm
• Receiver input power: +10 dBm to −55 dBm
• Maximum input average power: +16 dBm (receiver), +22 dBm (external source port)
• Average power measurement uncertainty: ±15%
• Average power measurement linearity: ±0.06 dB
• Return loss: −50 dB (receiver), 35 dB (external source port)

Degree of Polarization Uncertainty (wavelength-dependent)
• 1200–1280 nm: ±5.0%
• 1280–1340 nm: ±2.0%
• 1470–1580 nm: ±2.0%
• 1580–1600 nm: ±3.0%

Measurement Rate
• >2000 measurements per second

External Source Input Port
• Wavelength range: 1200 nm to 1580 nm
• Input power range: +16 dBm to −49 dBm
• Internal path insertion loss: 8.5 dB

– Key Features

• Four-diode detection architecture
• Automatic three-state polarization generator
• Compatibility with single-wavelength and swept-wavelength external sources
• Integrated laser sources (Option 001): 1310 nm and 1550 nm Fabry-Perot lasers
– 1310 nm output: 200–500 µW (typical 300 µW)
– 1550 nm output: 150–400 µW (typical 230 µW)
• Polarization state of signal (SOP) measurement
• Stokes parameter comparison with three data markers
• Fast automated PDL measurement in optical components
• Two automated PMD measurement modes

– Typical Applications

Polarization-dependent loss characterization in components and subsystems; polarization-mode dispersion evaluation; optical signal SOP monitoring and reference frame establishment.

– Compatibility & Integration

The complete 8509B includes integrated controller. Keysight provides support for the full instrument configuration.