The Agilent/Keysight 8510C is a modular vector network analyzer system for precise S-parameter characterization across 45 MHz to 110 GHz. It measures magnitude, phase, and group delay of two-port networks with real-time error correction, time-domain analysis via inverse Fourier transform, and an internal adapter removal feature for non-insertable devices.
– Technical Specifications
Frequency Coverage
• Broadband range: 45 MHz to 110 GHz
• Coaxial measurements: up to 50 GHz (2.4 mm), up to 65 GHz (1.85 mm), up to 110 GHz (1.0 mm)
• Waveguide measurements: 33 GHz to 110 GHz
Measurement Resolution
• Magnitude: 0.001 dB
• Phase: 0.01 degrees
• Group delay: 0.01 nanoseconds
Dynamic Performance
• Effective directivity and source match: 60 dB
• Receiver dynamic range: up to 106 dB (frequency-dependent)
• System dynamic range: up to 93 dB (frequency-dependent)
• Overall available dynamic range: 80 to 100 dBm
Power Specifications
• Maximum power (port 2): +20 dBm (45 MHz–2.2 GHz), +17 dBm (2–20 GHz), +12 dBm (33–50 GHz)
• Reference power (port 1, nominal): +2 dBm, –2 dBm, or +5 dBm (configuration-dependent)
• Minimum power (port 2): –66 dBm (45 MHz–2.2 GHz), –76 dBm (2–20 GHz), –87 dBm (33–50 GHz)
– Key Features
• Thru-Reflect-Line (TRL) precision two-port calibration for coaxial measurements
• Line-Reflect-Match calibration for on-wafer and in-fixture applications
• Full two-port calibration with sliding loads
• Internal adapter removal for accurate non-insertable device measurements
• Optional time-domain response analysis via inverse Fourier transform
– Typical Applications
Characterization of passive and active microwave components, on-wafer device testing, in-fixture measurement, waveguide component analysis, and broadband network characterization from microwave through millimeter-wave frequencies.
– Compatibility & Integration
Highly configurable architecture supports user-selected sources, S-parameter test sets, and accessories. Measurement capability spans coaxial connectors (2.4 mm, 1.85 mm, 1.0 mm) and waveguide interfaces.



























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