Agilent/Keysight 85564A

The Agilent/Keysight 85564A is a 3-in-1 OSL mechanical calibration kit for VNA calibration and verification across DC to 50 GHz. This compact, lightweight unit combines Open, Short, and Load standards in a single assembly, enabling fast, repeatable calibration of network analyzers and RF test instruments equipped with 2.4 mm connectors.

– Technical Specifications

• Product Type: Mechanical Calibration Kit (3-in-1 OSL configuration)
• Frequency Range: DC to 50 GHz
• Connector: 2.4 mm male
• Construction: Rugged internal structure with tight tolerances for broadband performance. Distributed resistive element on sapphire substrate ensures excellent stability and return loss.
• Mechanical Verification: Center conductor protrusion and pin depth verified using special gaging processes and electrical testing at factory.

– Key Features

• Integrated Standards: Open and Short standards match the 85056D calibration kit; Load standard delivers equivalent electrical performance with different part specifications.
• Repeatable Connections: Precision-built mechanical tolerances deliver stable, repeatable RF performance across the full frequency band.
• Compact Form Factor: Designed for easy handling and integrated into a foam-lined storage case for transport protection.
• Factory Calibration: All mechanical dimensions and electrical characteristics verified during manufacturing to ensure performance stability.

– Typical Applications

• VNA calibration in R&D and manufacturing environments
• Component characterization and validation
• Service and field verification of RF test systems
• S-parameter measurement uncertainty assessments

– Compatibility & Integration

The 85564A calibrates Keysight vector network analyzers rated to 50 GHz when measuring components with 2.4 mm connectors. Operation with Keysight precision interfaces ensures adherence to published electrical specifications. Related documentation includes the 85563A/85564A installation guide, calibration standard definitions, and S-parameter measurement uncertainty references.