The Agilent/Keysight 86120B Multi-Wavelength Meter measures wavelength and optical power across the 700–1650 nm spectrum using a Michelson interferometer. It simultaneously characterizes multiple laser lines with absolute accuracy to ±3 ppm, making it ideal for DWDM signal analysis, Fabry-Perot laser evaluation, and optical component testing. The instrument delivers wavelength scan results in less than 1 second and includes a built-in HeNe laser for real-time calibration.
– Technical Specifications
• Wavelength Range: 700 nm to 1650 nm (182 to 428 THz)
• Absolute Wavelength Accuracy: ±3 ppm for lines separated by >30 GHz; ±0.005 nm at 1550 nm; ±0.004 nm at 1310 nm
• Differential Accuracy: ±2 ppm
• Maximum Laser Lines: 100 simultaneous inputs
• Wavelength Scan Speed: <1 second
• Optical Input: 9/125 µm single-mode fiber via 81000 series connector (sold separately)
• Input Power Range: +10 dBm typical; +18 dBm maximum (safe input level)
• Power Measurement Resolution: 0.01 dB
• Amplitude Accuracy & Linearity: ±0.3 dB (1200–1600 nm)
• Polarization Dependence: ±1.0 dB (700–1650 nm)
• Noise Bandwidth: 0.1 nm
• Laser Line Width Tolerance: 10 GHz
– Key Features
• Dual-mode operation: Normal Update and Fast Update modes
• Built-in HeNe laser standard for continuous recalibration
• Broadband measurement capability (firmware v2.0+) for chirped lasers and broadband devices
• Measures average wavelength, total optical power, laser line separation, wavelength and power drift, and signal-to-noise ratios
• GPIB programming interface for automated test sequences
• Parallel printer port for hardcopy documentation
• Stabilization time: 15 minutes continuous operation
– Electrical & Physical
• Power Consumption: 70 W maximum
• AC Input: 100–240 V, 50–60 Hz
• Dimensions: 140 × 340 × 465 mm (H × W × D)
• Weight: 8.5 kg
• Form Factor: Plug-in/rackmount
– Typical Applications
Laser characterization, DWDM system validation, optical amplifier testing, coherence length measurement, and laser drift monitoring in laboratory and manufacturing environments.



























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