Agilent/Keysight 86145A

The Agilent/Keysight 86145A is a portable optical spectrum analyzer engineered for high-precision measurement and analysis of optical signals across telecommunications, component testing, research, and field deployment. It delivers broad wavelength coverage, exceptional resolution, and calibrated accuracy optimized for dense wavelength-division multiplexing (DWDM) systems and demanding power/wavelength characterization.

– Technical Specifications

Wavelength Range: 600 nm to 1700 nm

Wavelength Accuracy:
• After internal calibration: ±0.025 nm (1510–1570 nm), ±0.035 nm (1570–1640 nm)
• After user calibration within ±40 nm: ±0.05 nm
• After user calibration over full range: ±0.2 nm
• With enhanced internal calibration: ±10 pm (1480–1570 nm), ±25 pm (1570–1620 nm)
• With external single-point calibration: ±10 pm (within 10 nm of reference)
• Reproducibility (≤1 min): ±0.003 nm; Tuning repeatability: ±0.003 nm

Resolution Bandwidth (FWHM, selectable): 0.07, 0.1, 0.2, 0.5, 1, 2, 5, 10 nm

Span Range: 0.2 nm to full range; zero span capable

Sensitivity (no averaging):
• 600–750 nm: –60 dBm
• 750–1250 nm: –75 dBm
• 1250–1610 nm: –90 dBm
• 1610–1700 nm: –80 dBm

Maximum Input Power:
• 600–1000 nm and 1525–1700 nm: +15 dBm per channel
• 1000–1525 nm: +12 dBm per channel
• Total safe power: +30 dBm; within any 10 nm span: +23 dBm

Dynamic Range (1250–1610 nm, 0.1 nm RBW, chop mode on): Typical –70 dB

Amplitude Accuracy: ±0.5 dB at –20 dBm (1310 nm/1550 nm); Scale fidelity: ±0.05–0.07 dB

Amplitude Stability:
• 1 minute: ±0.01 dB
• 15 minutes: ±0.02 dB (typical)

– Key Features

• Selectable resolution bandwidth supports DWDM channel analysis
• Exceptional close-in dynamic range enables sub-50 GHz channel separation characterization
• Multiple calibration modes—internal, user-defined, and external single-point—accommodate field and lab workflows
• High sensitivity across visible to infrared spectrum minimizes measurement averaging requirements

– Typical Applications

• DWDM system characterization and channel isolation verification
• Optical component spectral analysis (filters, multiplexers, sources)
• Field power and wavelength measurements in installed networks
• Research-grade spectral profiling in 600–1700 nm window