Agilent / Keysight 8657B Synthesized Signal Generator, 100 kHz to 2060 MHz

The Agilent/Keysight 8657B is a synthesized signal generator delivering precise RF signal generation across 100 kHz to 2060 MHz. Built for RF design, manufacturing, and maintenance testing, it combines wide frequency coverage with exceptional spectral purity and fast switching. The instrument supports multiple modulation modes and operates into 50 Ω loads with tight level accuracy and low phase noise across its entire range.

– Technical Specifications

Frequency Performance
• Range: 100 kHz to 2060 MHz (underrange capability to 10 kHz uncalibrated)
• Resolution: 1 Hz
• Switching Speed: ≤35 ms (typically 30 ms at 25 °C)
• Accuracy and Stability: Timebase-referenced

Output Level
• Range: +13 dBm to –143.5 dBm into 50 Ω (100 kHz–1 MHz: +10 dBm to –143.5 dBm)
• Resolution: 0.1 dB
• Level Flatness: ±0.5 dB (100 kHz to 2.06 GHz at 0 dBm setting)
• Absolute Accuracy: ±1.5 dB (>+3.5 dBm); ±1.0 dB (+3.5 to –127 dBm); ±1.5 dB (<–127 dBm)
• Output Impedance: 50 Ω nominal
• Reverse Power Protection: 50 watts; Maximum DC Voltage: 25 V
• SWR: <1.5 (≤–6.5 dBm); <2.0 (≤+13 dBm)

Spectral Purity (CW Mode)
• SSB Phase Noise (20 kHz offset): –124 to –136 dBc/Hz across frequency bands, with best performance (–136 dBc/Hz) in the 130–260 MHz region
• Residual FM (300 Hz–3 kHz BW): <4 Hz across bands; (50 Hz–15 kHz BW): <8 Hz maximum
• Residual AM: <0.04% (50 Hz–15 kHz)
• Harmonics: <–30 dBc (0.1–1.03 GHz); <–25 dBc (1.03–2.06 GHz) at ≤+7 dBm
• Subharmonics: <–40 dBc (1.03–1.8 GHz); <–35 dBc (1.8–2.06 GHz) at ≤+7 dBm

– Key Features

• 1 Hz frequency resolution with <35 ms switching
• 160.5 dB dynamic range (from +13 dBm to –143.5 dBm)
• Level flatness within ±0.5 dB across entire range
• Low phase noise enabling sensitive receiver and component testing
• Pulse modulation capable (option-dependent)
• Timebase-grade frequency accuracy

– Typical Applications

• Receiver sensitivity and selectivity characterization
• Component and subsystem RF testing
• Automated manufacturing test systems
• Benchtop RF circuit development and validation
• Transceiver performance measurements