The Keysight B1505AP is a modular power device analyzer and curve tracer engineered for high-power semiconductor device characterization. It delivers measurements from sub-picoamp levels to 1500 A across voltage ranges up to 10 kV, with minimum resolution of 10 fA / 0.5 µV and micronohm-level on-resistance capability. The instrument ships in eight pre-configured packages addressing specific voltage, current, and capacitance requirements, with a 10-slot mainframe supporting plug-in module expansion.
– Technical Specifications
Measurement Range
• Voltage: Up to 10 kV
• Current: Sub-picoamp to 1500 A
• Resolution: 10 fA / 0.5 µV minimum
• On-resistance: Micronohm (µΩ) level
Capacitance Measurement
• DC bias range: Up to ±3 kV and up to 3000 V DC bias
• AC frequency sweep: 1 kHz to 5 MHz multi-frequency capability
• Automated parameter extraction: Ciss, Coss, Crss
Pulsed Measurements & Switching Characterization
• Pulse width: Down to 10 µs minimum
• High voltage/high current fast switch option for GaN current collapse evaluation
Thermal Testing
• Temperature range: −50 °C to +250 °C fully automated
• Interlock-equipped fixture for safe temperature-dependent operation
Gate Charge & On-Wafer Testing
• Packaged device and on-wafer IGBT/FET characterization
– Key Features
• Two independent analog-to-digital converters per channel enabling simultaneous voltage/current measurement at 2 µs sampling rate
• Up to five 3 kV source/measure channels
• Automatic switching between high-voltage and high-current operation without recabling
• Module selector and device capacitance selector for fully automated measurement sequencing
• Standard interlock test fixtures for packaged device testing
• Oscilloscope waveform monitoring during device evaluation
• Windows 10-based EasyEXPERT software with curve tracer mode and familiar knob control interface
– Modules & Expandability
Supported modules: High Voltage SMU (HVSMU), High Current SMU (HCSMU), Ultra High Current (UHC), Ultra High Voltage (UHV), and High Voltage Medium Current (HVMC) with upgrade capability via plug-in expansion.
– Typical Applications
High-power semiconductor device evaluation, power module characterization, GaN/SiC device testing, and temperature-dependent thermal analysis.
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