The Agilent/Keysight B1542-60003 is a cable and accessory component for the B1542A Pulsed IV Parametric Test Solution, engineered to support precision semiconductor device characterization on advanced process nodes. This accessory enables accurate Id-Vd and Id-Vg measurements with a minimum gate pulse width of 10 ns and rapid 2 ns rise and fall times, delivering minimal overshoot and undershoot. Current measurement resolution reaches 1 µs, enabling seamless transitions between DC and pulsed measurement modes. The solution targets high-K and SOI MOSFET characterization, supporting pulse widths from 10 ns to 1 ms and pulse base voltages within ±3 V range.
– Technical Specifications
• Minimum gate pulse width: 10 ns
• Pulse rise and fall times: 2 ns
• Current measurement resolution: 1 µs
• Pulse width range: 10 ns to 1 ms
• Pulse base voltage limit: ±3 V
– Key Features
• Dual-mode operation supports both DC and pulsed measurements
• Minimal pulse overshoot and undershoot for accurate characterization
• Compatible with leading Keysight semiconductor parameter analyzers
• Integrated with EasyEXPERT group+ GUI-based characterization software
– Typical Applications
• High-K and SOI MOSFET pulsed IV characterization
• Advanced semiconductor process development and device evaluation
• Id-Vd and Id-Vg measurement on process nodes
– Compatibility & Integration
The B1542-60003 integrates with the B1500A Semiconductor Device Parameter Analyzer, E5270B Precision Measurement Mainframe, E5260A/E5262A/E5263A analyzers, and 4155/56C and 4155/56B legacy systems. Software support includes Keysight EasyEXPERT group+, compatible with B1500A’s embedded Windows 10 platform or external PC operation.
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