The Agilent/Keysight E1411B is a C-size, single-slot VXI module that integrates dual ADC paths for precision data acquisition and automated test systems. It combines a 5.5-digit, low-noise integrating ADC with a 14-bit sampling ADC capable of 13 kHz readings, delivering measurement resolution across DC/AC voltage, resistance, and temperature transducers. The module supports 2-wire and 4-wire resistance measurement modes, offset-compensated resistance, and direct thermocouple, thermistor, and RTD inputs. A built-in timer/pacer with 2 µs resolution and programmable delay enables flexible trigger control from 76 µs to 16 s, while external trigger capability accepts pulses down to 100 ns width at rates to 5 kHz. Designed for seamless coupling with VXI relay or FET multiplexers, the E1411B scales to multichannel scanning configurations. Aperture settings range from 320 ms to 10 µs, optimizing speed and noise trade-offs for each application.
– Technical Specifications
• Resolution: 5.5 digits
• Integrating ADC: 5.5-digit, low-noise
• Sampling ADC: 14-bit, up to 13 kHz
• Maximum Reading Rate: 13 kS/s (10 µs aperture)
• Measurement Functions: DC voltage (Vdc), AC voltage (Vac), 2-wire resistance, 4-wire resistance, offset-compensated resistance, thermocouples, thermistors, RTDs
• Aperture Options: 320 ms, 267 ms, 20 ms, 16.7 ms, 2.5 ms, 100 µs, 10 µs
DC Voltage Accuracy (90-day, 125 mV range):
• 20/16.7 ms aperture: ±(0.023% + 9 µV)
• 10 µs aperture: ±(0.115% + 64 µV)
Four-Wire Resistance Accuracy (90-day, 256 Ω range):
• 20/16.7 ms aperture: ±(0.035% + 18.2 mΩ)
• 10 µs aperture: ±(0.12% + 58.2 mΩ)
AC Voltage Accuracy (90-day, 300 V range, True RMS):
• 20–50 Hz: ±(2.125% + 2.5 V)
• 50 Hz–1 kHz: ±(0.625% + 500 mV)
– Key Features
• Built-in timer/pacer: 76 µs to 65.5 ms range, 2 µs resolution
• Programmable delay: 40 µs to 16 s, 2 µs resolution
• External trigger: 100 ns minimum pulse width, 5 kHz maximum rate
• Autoranging support
• 450 Vpk isolation between terminals
– Compatibility & Integration
Integrates with VXI relay and FET multiplexers for multichannel scanning multimeter systems.























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