The Agilent/Keysight E3620A is a 50 W dual-output DC power supply engineered for benchtop test and development environments. It delivers two independent, isolated outputs—each capable of 0 to 25 Vdc at up to 1 A—with constant voltage and constant current operating modes. Manual 10-turn potentiometers provide precise voltage and current adjustment. Digital panel meters display simultaneous voltage and current readings with ±0.5% + 2 counts accuracy. Low output noise (0.35 mV rms typical), excellent line and load regulation (0.01% + 2 mV), and fast transient response (<50 µsec) make it suitable for sensitive analog circuits and device characterization.
– Technical Specifications
Output Performance
• Dual isolated outputs: 0–25 Vdc, 1 A maximum per channel
• Total power capacity: 50 W
• Output ripple and noise: <0.35 mV rms, <1.5 mV p-p (20 Hz – 20 MHz)
• Line regulation: <0.01% + 2 mV
• Load regulation: <0.01% + 2 mV
• Load transient response: <50 µsec recovery to within 15 mV
• Output voltage drift: <0.1% + 5 mV over 8 hours (after 30 min warm-up)
• Temperature coefficient: <0.02% + 1 mV per °C
• Isolation: ±240 Vdc
• Common mode current: 20 V); 1 mA current
• Meter accuracy: ±0.5% + 2 counts at 25 °C ±5 °C
• Manual control via 10-turn potentiometers
Physical & Environmental
• Dimensions: 88.1 mm H × 212.3 mm W × 318.4 mm D (3.5″ × 8.4″ × 12.5″)
• Weight: 3.8 kg (8.4 lbs) net
• Cooling: Convection
• Operating temperature: 0–40 °C (full rated output); linear current derating to 50% at 55 °C maximum
• Certification: CSA 22.2 No. 231, IEC 1010-1
– Key Features
• Dual independent outputs with full isolation for multi-rail test setups
• Manual CV/CC mode selection without external programming requirements
• Digital readout for real-time voltage and current monitoring
• Binding post terminals for secure, reliable connections
• Low ripple performance suitable for precision analog measurement
• Convection cooling—silent operation, no fan noise
– Typical Applications
• Benchtop circuit development and breadboard testing
• Device characterization and parametric measurement
• Analog front-end supply for test instruments
• Educational laboratory experiments
• Two-rail power distribution for mixed-signal designs
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