Agilent/Keysight E4440A

The Agilent/Keysight E4440A is a high-performance spectrum analyzer engineered for RF and microwave signal analysis across demanding R&D, manufacturing, and field-test environments. Operating from 3 Hz to 26.5 GHz (DC coupled) with optional external mixer capability to 325 GHz, the E4440A delivers absolute amplitude accuracy of ±0.19 dB and a displayed average noise level of −155 dBm (−169 dBm with internal preamplifier). Phase noise performance reaches −118 dBc/Hz at 10 kHz offset, while third-order intermodulation input of +19 dBm at 1 GHz ensures superior dynamic range for complex signal environments.

– Technical Specifications

• Frequency Range: 3 Hz to 26.5 GHz (DC coupled); 20 MHz to 26.5 GHz (AC coupled); up to 325 GHz with external mixers
• Amplitude Accuracy: ±0.19 dB absolute; ±0.35 dB (DSP mode)
• Noise Floor: −155 dBm DANL; −169 dBm with preamplifier
• Phase Noise: −118 dBc/Hz @ 10 kHz offset
• TOI: +19 dBm @ 1 GHz
• W-CDMA ACLR Dynamic Range: 81 dB
• Resolution Bandwidth: 1 Hz to 3 MHz with 160 settings; 4, 5, 6, 8 MHz options
• Analysis Bandwidth: 10 MHz standard; 40 MHz (Option 140) or 80 MHz (Option 122) optional; 300 MHz for calibrated VSA
• Sweep Speed: 1 µs to 6000 s (zero span); 2 ms to 2000 s (swept)
• Maximum Input: +30 dBm continuous; +25 dBm with preamplifier; +50 dBm for pulsed signals (<10 µs, <1% duty cycle, ≥30 dB attenuation)
• Frequency Reference Stability: ±1 × 10⁻⁸ (20–30 °C); ±5 × 10⁻⁸ (0–55 °C); ±1 × 10⁻⁷/year aging
• Trigger Options: Free-run, line, video, RF burst, external (front/rear), frame; delay −150 ms to +500 ms
• Trace Points: 2 to 8192

– Key Features

• Front-panel Type N (50 Ω) RF input; optional APC-3.5 connector (Option BAB)
• LAN connectivity with PCL3/PCL5 support
• USB device interface (Option 111) and parallel printer port
• Agilent VEE compatible with plug-and-play drivers
• Frequency reference aging rate of ±1 × 10⁻⁷/year
• Gated sweep capability: 10 µs to 500 ms gate length

– Typical Applications

• Multicarrier signal characterization and spectral monitoring
• Pulse and burst signal analysis
• Intermodulation and harmonic distortion measurement
• Frequency reference and phase noise testing

– Compatibility & Integration

LAN and USB interfaces enable integration with automated test systems. PCL3 and PCL5 support provides established remote-control protocols. Microsoft application compatibility facilitates screen capture and data export workflows.