Agilent/Keysight E5100A

The Agilent/Keysight E5100A is a high-speed network analyzer engineered for rapid production-line testing of resonators, filters, and electronic components. It delivers measurement cycles as fast as 0.04 ms/point through optimized waveform analysis and high-speed processor architecture, directly reducing test time and cost. The instrument spans 10 kHz to 300 MHz (180 MHz variant also available), with selectable IF bandwidths from 10 Hz to 30 kHz enabling low-noise measurements and dynamic range exceeding 120 dB at 1 kHz IFBW. Accuracy is ±0.05 dB and ±0.3 degrees.

– Technical Specifications

Frequency Range:
• 10 kHz to 300 MHz
• 10 kHz to 180 MHz (cost-optimized variant)

Measurement Speed:
• 0.04 ms/point (fastest sweep speed)
• Ramp sweep and step sweep modes

IF Bandwidth:
• 10 Hz to 30 kHz, selectable in 1, 1.5, 2, 3, 4, 5, 8 step increments

Dynamic Range:
• >120 dB (at IFBW = 1 kHz)

Accuracy:
• ±0.05 dB (amplitude)
• ±0.3 degrees (phase)

Output Power:
• Standard: −9 dBm to +11 dBm
• Extended range (Option 010): −48 dBm to +22 dBm

Frequency Stability (Option 1D5):
• 1 ppm

Input Impedance:
• 50 Ω nominal (standard)
• 50 Ω / 1 MΩ, 30 pF selectable (options available)

– Key Features

Measurement Parameters: Gain (amplitude ratio), phase, group-delay, amplitude, gain-phase, gain-delay, impedance, and admittance

Dynamic Accuracy: 120 dB dynamic range at 1 kHz IF bandwidth with fine-resolution bandwidth selection eliminates measurement fluctuation and noise floor constraints

Return Loss: 20 dB (SPC) across full frequency range

Spurious Performance: <−45 dBc non-harmonic signals (Option 001, −4 dBm output)

Display: 6.5-inch color LCD

Programming: Instrument BASIC and IBASIC automation support

Storage: Flexible disk drive (720 kB, 1.2 MB, 1.44 MB modes) and internal non-volatile memory

– Typical Applications

Resonator and filter characterization, component acceptance testing, production-line high-throughput screening, and impedance/admittance measurements in manufacturing environments

– Compatibility & Integration

Parallel I/O interfaces and BASIC-based programmability enable integration into automated test stations and legacy manufacturing systems.