The Agilent/Keysight E5405A Pro Series Soft Touch Connectorless Probe is a high-performance probing solution for precision signal acquisition in multi-channel test environments. The probe delivers low-capacitance access to target board signals through an industry-standard connectorless footprint, eliminating the need for traditional connectors and enabling reliable measurements on space-constrained designs without board-side connector hardware.
– Technical Specifications
• Signal Channels: 17 total — configurable as 16 single-ended or differential data channels plus 1 single-ended or differential clock channel
• Load Capacitance: 2.5 Gb/s
• Minimum Signal Amplitude: 200 mV (Vmax-Vmin)
– Key Features
• Soft Touch Connectorless Design: Pro Series interface is 30% smaller than previous versions, enabling integration into space-constrained PCB layouts. No connector required on target board.
• Micro Spring-Pin Technology: Delivers reliable contact with signal pads across uneven or contaminated board surfaces without requiring special plating or site preparation.
• Top-Side Retention Module: Mounts on the probe-side of the board, eliminating the need for back-side access or specialized modules for thick PCBs. Each probe includes a kit of five retention modules (Keysight E5403A) for probe attachment and pad alignment.
• Universal Board Compatibility: Operates on all board finishes, including lead-free surfaces.
• Extended Probe Life: Soft touch technology promotes durability without demanding special preparation of the probe contact site.
– Typical Applications
Multi-channel signal acquisition in complex digital systems, protocol analysis, and high-speed data validation where minimal capacitive loading and non-invasive access to test points are critical.
– Compatibility & Integration
• Logic Analyzer Interface: Compatible with logic analyzers equipped with 90-pin cable connectors
• Board Footprint: Designed for industry-standard Pro Series soft touch connectorless footprint
• Documentation: User’s Guides, Data Sheets, Application Notes, and Reference Guides available
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