The Agilent/Keysight E8311A is a VXI C-size, 1-slot, register-based pulse and pattern generator delivering precise digital pulse patterns across two single-ended output channels. Operating from 1 mHz to 165 MHz, it generates patterns up to 16 Kbit per channel with transition times as fast as 600 ps typical (ECL) and period ranges from 6.06 ns to 999.5 s. Output amplitude spans 100 mVp-p to 10.0 V into 50 Ω with ± (1% + 50 mV) accuracy and 10 mV resolution. The instrument supports multiple trigger modes—continuous, external triggered, external gated, external width, manual, and internal triggered—enabling synchronization in complex test environments. Jitter performance reaches 0.01% ± 15 ps with PLL enabled. Source impedance is selectable between 50 Ω and 1 kΩ, with load compensation for non-standard loads. SMA (f) 3.5 mm connectors provide direct integration into test systems.
– Technical Specifications
• Frequency Range: 1 mHz to 165 MHz
• Pattern Length: 16 Kbit per channel
• Output Channels: Two single-ended
• Output Connectors: SMA (f) 3.5 mm
• Output Amplitude: 100 mVp-p to 10.0 V (50 Ω into 50 Ω)
• Level Window: -10.0 V to +10.0 V (50 Ω into 50 Ω)
• Output Amplitude Accuracy: ± (1% + 50 mV)
• Output Resolution: 10 mV
• Source Impedance: Selectable 50 Ω or 1 kΩ
• Transition Times: 600 ps typical (ECL), 1.0 ns typical (TTL), 2 ns to 200 ms variable
• Period Range: 6.06 ns to 999.5 s
• Width Range: 3.03 ns to (period – 3.03 ns)
• Jitter (RMS): 0.01% ± 15 ps (with PLL); ± 3% ± 250 ps (without self-calibration)
• Short Circuit Current: ± 400 mA max
• Baseline Noise: 10 mV RMS typical
• Dynamic Crosstalk: <0.1% typical
• Overshoot/Preshoot/Ringing: ± 5% of amplitude
– Key Features
• Programmable high and low levels with device-under-test protection
• Output relays for connection/disconnection (HiZ capability)
• Normal/complement output selection
• Load compensation for actual impedances other than 50 Ω
• Dual trigger architecture supporting continuous and burst operation
– Trigger and Synchronization Modes
• Continuous pulse, double pulse, burst, and pattern generation
• External triggered on rising, falling, or both edges
• External gated with level-based enable
• External width for pulse shape recovery
• Manual trigger simulation
• Internal triggered via PLL or up-command
– Typical Applications
• Functional verification of high-speed digital and mixed-signal devices
• Clock generation for automated test systems
• Radar signal testing
• Flash memory verification
• Serial bus protocol testing
– Compatibility & Integration
Functionally compatible with Keysight 81110A. VXIplug&play software drivers enable direct integration into manufacturing test environments.



























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