Agilent/Keysight E8362C

The Agilent/Keysight E8362C is a high-performance PNA Series vector network analyzer that characterizes RF and microwave components from 10 MHz to 20 GHz with 123 dB dynamic range and sub-microsecond measurement speed. Built on a flexible platform for aerospace, defense, telecommunications, and research applications, it delivers trace noise below 0.006 dB rms and supports up to 32 measurement channels with 20,001 points per channel.

– Technical Specifications

• Frequency Range: 10 MHz to 20 GHz
• Dynamic Range: 123 dB at 20 GHz at test port
• Trace Noise: < 0.006 dB (0.002 dB rms at 1 kHz bandwidth)
• Measurement Speed: 4.5 to 26 µsec/point
• Thermal Stability: 0.05 dB/°C
• Measurement Channels: 32 (up to 20,001 points per channel)
• Test Ports: 3.5 mm male 50-ohm connectors
• Maximum Output Level: 10 dBm
• Source Attenuator: 60 dB in 10 dB steps
• Display: 8.4 inch color LCD

– Key Features

• Built-in 2-port S-parameter test set with 3.5 mm connectors
• Advanced calibration: TRL/LRM, QSOLT, vector error correction, and N-port techniques
• On-wafer, in-fixture, waveguide, and antenna measurement support
• Wide ECal module compatibility
• Mixer characterization: conversion loss/gain, match parameters, isolation, compression, group delay, and scalar/vector calibration modes
• Amplifier measurements including gain compression, harmonic, IMD, and pulsed-RF analysis
• Frequency converter and offset measurements with selectable embedded LO capability
• Single-ended and balanced measurement modes
• Multiport configurations with full cross-bar optimization
• Pulsed-RF measurement support

– Typical Applications

Component characterization in aerospace and defense systems, telecommunications infrastructure testing, research laboratory measurements, on-wafer device characterization, and integrated circuit validation.

– Compatibility & Integration

The analyzer integrates with industry-standard 3.5 mm 50-ohm test fixtures and supports multiple calibration standards. Options available for scalar-calibrated converter measurements, frequency converter applications, embedded LO measurements, pulsed-RF capability, and high-power measurements.