Agilent/Keysight N4903B

The Keysight N4903B is a multi-channel serial Bit Error Rate Tester (BERT) designed for R&D and validation of high-speed digital communication systems. It delivers precise characterization and stress testing of transceiver modules and devices with serial I/O ports across industry-standard interfaces. The instrument combines pattern generation, error detection, and integrated jitter injection to validate receiver tolerance and transmitter performance in advanced digital interfaces.

– Technical Specifications

Data Rate Performance
• Pattern Generator and Error Detector: 150 Mb/s to 7 Gb/s, or up to 12.5 Gb/s
• Extended capability with option: 14.2 Gb/s
• Maximum with 2:1 multiplexer and demultiplexer: 28.4 Gb/s

Jitter Injection and Measurement
• Integrated, calibrated jitter sources exceeding 0.5 UI
• Random Jitter (RJ): 0 to 20 mUI rms (0 to 280 mUI pp)
• Periodic Jitter (PJ1 + PJ2) with Option D14 (>12.5 Gb/s): 0 to 2.0 UI
• Jitter modulation frequency: 1 kHz to 100 MHz
• Jitter types: RJ, RJ-LF, RJ-HF, PJ1, PJ2, Sine Jitter, Bursty Jitter, Inter-Symbol Interference, sinusoidal interference, triangular and arbitrary Spread Spectrum Clocking, residual SSC

Clock and Data Recovery
• Built-in CDR with tunable, compliant loop bandwidth
• Half-rate clocking with variable duty cycle (Option 003)
• Operation at full or half bit-rate

Pattern Generation
• PRBS and user-defined patterns
• 60-block pattern sequencer with real-time switching via auxiliary input
• Independent PRBS and pattern generation on auxiliary data output

– Key Features

• Bit Error Rate, BER Contour, and automated jitter tolerance measurements
• Total Jitter with RJ/DJ separation and Eye Diagram analysis
• Eye Mask testing and Frame Error Rate (FER) detection
• Symbol Error Rate (SER) on coded and retimed data streams
• Pattern Capture functionality
• Differential I/Os optimized for serial bus standards

– Typical Applications

• Receiver jitter tolerance characterization
• Transmitter signal quality validation
• Serial I/O compliance testing
• Device stress testing and margin analysis

– Compatibility & Integration

Differential I/O interfaces designed to match serial bus standards. Supports Option 003 for half-rate clocking and duty cycle distortion testing.