Agilent/Keysight N4962A

The Agilent/Keysight N4962A is a serial Bit Error Rate Tester (BERT) engineered for production-line testing, manufacturing, and characterization of high-speed optical transceivers and digital communication devices up to 12.5 Gb/s. Its compact form factor and straightforward local push-button and GPIB remote interfaces enable placement close to the device under test, minimizing cabling complexity. The instrument combines highly integrated custom ASICs for superior reliability and reduced thermal dissipation, making it ideal for manufacturing floors, incoming inspection stations, and R&D environments.

– Technical Specifications

Data Rate Performance
• 0.5 to 12.5 Gb/s with external clock
• 9.90 to 11.35 Gb/s with internal clock synthesizer (programmable to 9.85 GHz)

Clock System
• Internal synthesizer: 9.90 to 11.35 GHz
• External clock input: 618.75 to 709.375 MHz, 2 Vpp max, AC coupled 50 Ω SMA
• TX and RX clock outputs: 9.90 to 11.35 GHz, 1 Vpp typical, AC coupled 50 Ω SMA
• RX external clock input: 0.5 to 12.5 GHz, 1–2 Vpp sensitivity, DC coupled 50 Ω SMA
• Jitter injection: DC to 100 MHz, 2 Vpp max, AC coupled interface

Pattern Generation & Detection
• Five selectable PRBS patterns with configurable mark-space density and pattern length
• Programmable output amplitude control
• Electronic phase adjustment on error detector

Trigger Outputs
• High-frequency trigger: 9.90 to 11.35 GHz, 1.3 Vpp typical, AC coupled 50 Ω SMA
• Low-frequency trigger (1/16 clock): 618.75 to 709.375 MHz, 0.5 Vpp typical, AC coupled 50 Ω SMA

Signal Interfaces
• Differential or single-ended input/output capability

– Key Features

• Dual clock architecture supports both internal synthesis and external clock references
• Frequency modulation capability for stressed eye characterization and jitter stress testing
• AC and DC coupled clock inputs accommodate diverse test environments
• Integrated custom ASICs reduce component count and operating temperature

– Typical Applications

• 10G optical transceiver production testing and characterization
• Wafer viscal testing, assembly validation, and transceiver production lines
• Communication component incoming inspection and qualification
• Manufacturing and R&D laboratory device validation

– Compatibility & Integration

Local control via front-panel push-buttons or remote GPIB interface for seamless integration into automated test environments.