Agilent / Keysight N5161A MXG ATE Analog Signal Generator 100 kHz to 3 or 6 GHz

The Agilent/Keysight N5161A MXG ATE Analog Signal Generator delivers RF stimulus for automated test equipment environments without a front-panel display. This headless architecture enforces remote operation via SCPI commands or web-enabled interface, making it purpose-built for rack-mount systems and ATE integration. As a streamlined variant of the N5181A MXG, it provides equivalent performance with simplified maintenance design. Note: This product is obsolete; the N5181A MXG X-Series is the current replacement.

– Technical Specifications

Frequency
• Range: 100 kHz to 3 GHz or 6 GHz (option-dependent)
• Resolution: 0.01 Hz
• Aging rate: ±5 ppm/10 years
• Temperature stability: ±1 ppm over 0 to 55 °C
• Reference input: 10 MHz standard; 1 to 50 MHz with option 1ER (0.1 Hz increments)
• Reference output: 10 MHz, ≥+4 dBm (nom) into 50 Ω

Amplitude
• Output power range: -127 dBm to +23 dBm (Option 1EQ extends to -144 dBm)
• Maximum output power: +23 dBm @ 1 GHz
• Resolution: 0.01 dB (nom)
• Electronic attenuator: 0 to 130 dB in 5 dB steps
• Reverse power protection: 50 VDC (nom), 2 W (nom) from 100 kHz to 6 GHz
• SWR: 1.4:1 typical (≤1.7 GHz), 1.55:1 (1.7–3 GHz), 1.7:1 (3–4 GHz), 1.6:1 (4–6 GHz)
• Absolute level accuracy (ALC On, 20–30 °C): ±0.6 dB to ±0.8 dB depending on frequency and option

Spectral Purity
• Phase noise: ≤-121 dBc/Hz (typ) @ 1 GHz, 20 kHz offset
• Harmonics: <-30 dBc
• Spurious signals: <-70 dBc

Modulation
• Types: AM, FM, PM, Pulse
• External modulation: AM, FM, PM inputs available with option UNT

– Key Features

• Headless design eliminates front-panel dependencies for ATE integration
• Web-enabled and SCPI-compliant remote control
• Frequency resolution to 0.01 Hz across full band
• Low phase noise (-121 dBc/Hz typ) supports sensitive receiver testing
• Wide amplitude range with 0.01 dB resolution
• Flexible reference input/output for system synchronization

– Typical Applications

• Receiver sensitivity and dynamic range characterization
• Transmitter spurious and harmonic validation
• Automated functional and production test
• System-level RF subsystem validation