Agilent / Keysight N5224A 43.5 GHz PNA Microwave Network Analyzer

The Keysight N5224A is a 43.5 GHz PNA Microwave Network Analyzer engineered for high-accuracy S-parameter characterization of complex microwave components and systems in R&D and manufacturing environments. It delivers system dynamic range to 127 dB with receiver dynamic range up to 132 dB, enabling precise measurements across demanding test scenarios. The instrument supports 2-port single-source or 4-port dual-source configurations, each with distinct performance capabilities. Its +13 dBm output power and 38 dB power sweep range accommodate diverse component testing requirements.

– Technical Specifications

• Frequency Range: 10 MHz to 43.5 GHz
• Ports: 2-port (single source) or 4-port (two built-in sources)
• System Dynamic Range: Up to 127 dB
• Receiver Dynamic Range: Up to 132 dB
• Dynamic Accuracy: 0.1 dB compression at +12 dBm input power
• Noise Floor: −114 dBm at 10 Hz IF bandwidth
• Output Power: +13 dBm
• Power Sweep Range: 38 dB
• Measurement Points: 100,001 points maximum
• Channels: 200 channels
• IF Bandwidth: 15 MHz
• Pulsed-RF Capability: Down to 50 ns pulse widths
• Power Consumption: 450 watts maximum
• Dimensions (with feet): 11.0 in (279.1 mm) H × 19.0 in (482.9 mm) W

– Key Features

• Electronic and TRL/LRM calibration methods for on-wafer and fixture-corrected measurements
• Time-domain analysis for improved accuracy and filter characterization
• Frequency offset mode for mixer and amplifier distortion testing
• Material measurements, signal integrity analysis, and millimeter-wave characterization
• Transmission line, free-space, cavity, and coaxial probe measurement options
• Four front-panel USB ports (0.9 A limit) and five rear-panel USB ports (2.0 A limit)
• 10/100BaseT Ethernet connectivity
• Auto-switching power supply: 100–120 VAC or 220–240 VAC, 50/60/400 Hz

– Typical Applications

• Component S-parameter verification and characterization
• On-wafer and fixture-based device testing
• Millimeter-wave system validation
• Pulsed-RF component analysis
• Material and dielectric property measurements

– Compatibility & Integration

USB 2.0 and 10/100BaseT Ethernet enable integration with automated test systems and remote control environments. Parallel port support accommodates legacy peripheral connections.