The Keysight N5239B is a 2-port microwave network analyzer spanning 300 kHz to 8.5 GHz, engineered for S-parameter characterization of passive and active components in R&D and manufacturing settings. This PNA-L series instrument delivers 133 dB dynamic range with 0.003 dB RMS trace noise, enabling precise measurements across signal integrity, materials characterization, gain compression, intermodulation distortion, noise figure, and frequency conversion applications. The analyzer supports mixed-mode and differential device measurements, source-phase control, and time-domain analysis using a single built-in source rated 6 dBm to 13 dBm output with -18 dBc harmonics.
– Technical Specifications
• Frequency Range: 300 kHz to 8.5 GHz
• Test Ports: 2 ports with 3.5 mm male connectors
• Dynamic Range: 133 dB
• Source Output Power: 6 dBm to 13 dBm
• Harmonic Content: -18 dBc
• Trace Noise: 0.003 dB RMS (typical)
• Sweep Time (201 points): 6 ms (best case)
• Receiver Noise Floor: Low
• Receiver Compression Level: High
• Stability: High
• Physical Dimensions: 48.3 × 49.8 × 28 cm
• Weight: Approximately 35–36 kg
• Operating Environment: 25 °C ±5 °C; 90 minutes warm-up required
– Key Features
• Single integrated source with stable output characteristics
• Multitouch display with intuitive operator interface
• USB connectivity for control and data transfer
• Low trace noise supports high-resolution measurements
• Fast sweep capability for production environments
• PNA-L firmware compatibility ensures feature consistency with higher-tier models
– Measurement Capabilities
• S-parameter measurements (scalar and vector)
• Passive and active device characterization
• Signal integrity and materials analysis
• Gain compression and intermodulation distortion (IMD)
• Noise figure quantification
• Frequency converter analysis
• Differential and I/Q device measurements
• Source-phase control
• Mixed-mode S-parameters for balanced/differential circuits
• Time-domain reflectometry and analysis
– Typical Applications
• Component testing in R&D laboratories
• Manufacturing quality control
• Filter and matching network design validation
• Amplifier and converter characterization
• Materials dielectric property measurement
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