Agilent / Keysight N5241B 13.5 GHz PNA-X Microwave Network Analyzer

The Agilent/Keysight N5241B is a 2-port microwave network analyzer operating from 300 kHz to 13.5 GHz, engineered for precise characterization of active and passive RF components in development and manufacturing environments. This instrument delivers 140 dB dynamic range and 0.001 dB RMS trace noise, enabling accurate S-parameter measurements, impedance analysis, and advanced nonlinear characterization. With measurement speeds reaching 45,000 points/sec in list mode and sub-microsecond sweep capabilities, the N5241B supports multiple calibration standards including SOLT, TOSM, and SSM. Power level accuracy of ±0.15 dB and phase noise below -105 dBc/Hz at 10 kHz offset ensure reliable results across the measurement bandwidth up to 1 MHz.

– Technical Specifications

• Frequency Range: 300 kHz to 13.5 GHz
• Ports: 2-port configuration
• Dynamic Range: 140 dB typical at 10 Hz IF bandwidth
• Trace Noise: 0.001 dB RMS typical at 10 kHz IF bandwidth
• Measurement Bandwidth: Up to 1 MHz
• Output Power: -60 dBm to +10 dBm typical
• Power Level Accuracy: ±0.15 dB typical
• Phase Noise: <-105 dBc/Hz at 10 kHz offset typical
• Source Harmonics: <-50 dBc
• Source Non-Harmonics: <-40 dBc
• Measurement Speed: Up to 125 µs per point typical; 45,000 points/sec in list mode
• Impedance: Configurable characteristic impedance (50 ohms, 75 ohms)

– Key Features

• S-parameter measurements (S11, S12, S21, S22)
• Sweep types: Power, Frequency, Electrical Delay, Power Sweep with list
• Calibration standards: SOLT, TOSM, SSM, Response, One-port, Custom kits
• Gain compression and P1dB characterization
• IP3 and intermodulation distortion (IMD) analysis
• Time domain analysis capabilities
• Noise figure measurements
• Harmonic and spur detection
• Pulse measurement support for RF device characterization
• Modulation distortion analysis under non-linear conditions
• Vector Signal Analysis (VSA) option available

– Typical Applications

• Component characterization across microwave frequencies
• Nonlinear device testing and modeling
• Mixed-signal component evaluation
• Pulsed RF device measurements
• High-power signal sourcing and measurement

– Compatibility & Integration

• Type-N female RF connectors for input/output ports
• External reference input capability